Daily Papers

In this paper, we introduce a new benchmark for continual learning in anomaly detection, aimed at better reflecting real-world deployment scenarios. Our benchmark, Continual-MEGA, includes a large and diverse dataset that significantly expands existing evaluation settings by combining carefully curated existing datasets with our newly proposed dataset, ContinualAD. In addition to standard continual learning with expanded quantity, we propose a novel scenario that measures zero-shot generalization to unseen classes, those not observed during continual adaptation. This setting poses a new problem setting that continual adaptation also enhances zero-shot performance. We also present a unified baseline algorithm that improves robustness in few-shot detection and maintains strong generalization. Through extensive evaluations, we report three key findings: (1) existing methods show substantial room for improvement, particularly in pixel-level defect localization; (2) our proposed method consistently outperforms prior approaches; and (3) the newly introduced ContinualAD dataset enhances the performance of strong anomaly detection models. We release the benchmark and code in https://github.com/Continual-Mega/Continual-Mega.

Anti-forensics seeks to eliminate or conceal traces of tampering artifacts. Typically, anti-forensic methods are designed to deceive binary detectors and persuade them to misjudge the authenticity of an image. However, to the best of our knowledge, no attempts have been made to deceive forgery detectors at the pixel level and mis-locate forged regions. Traditional adversarial attack methods cannot be directly used against forgery localization due to the following defects: 1) they tend to just naively induce the target forensic models to flip their pixel-level pristine or forged decisions; 2) their anti-forensics performance tends to be severely degraded when faced with the unseen forensic models; 3) they lose validity once the target forensic models are retrained with the anti-forensics images generated by them. To tackle the three defects, we propose SEAR (Self-supErvised Anti-foRensics), a novel self-supervised and adversarial training algorithm that effectively trains deep-learning anti-forensic models against forgery localization. SEAR sets a pretext task to reconstruct perturbation for self-supervised learning. In adversarial training, SEAR employs a forgery localization model as a supervisor to explore tampering features and constructs a deep-learning concealer to erase corresponding traces. We have conducted largescale experiments across diverse datasets. The experimental results demonstrate that, through the combination of self-supervised learning and adversarial learning, SEAR successfully deceives the state-of-the-art forgery localization methods, as well as tackle the three defects regarding traditional adversarial attack methods mentioned above.

During industrial processing, unforeseen defects may arise in products due to uncontrollable factors. Although unsupervised methods have been successful in defect localization, the usual use of pre-trained models results in low-resolution outputs, which damages visual performance. To address this issue, we propose PyramidFlow, the first fully normalizing flow method without pre-trained models that enables high-resolution defect localization. Specifically, we propose a latent template-based defect contrastive localization paradigm to reduce intra-class variance, as the pre-trained models do. In addition, PyramidFlow utilizes pyramid-like normalizing flows for multi-scale fusing and volume normalization to help generalization. Our comprehensive studies on MVTecAD demonstrate the proposed method outperforms the comparable algorithms that do not use external priors, even achieving state-of-the-art performance in more challenging BTAD scenarios.

Developing effective visual inspection models remains challenging due to the scarcity of defect data. While image generation models have been used to synthesize defect images, producing highly realistic defects remains difficult. We propose DefectFill, a novel method for realistic defect generation that requires only a few reference defect images. It leverages a fine-tuned inpainting diffusion model, optimized with our custom loss functions incorporating defect, object, and attention terms. It enables precise capture of detailed, localized defect features and their seamless integration into defect-free objects. Additionally, our Low-Fidelity Selection method further enhances the defect sample quality. Experiments show that DefectFill generates high-quality defect images, enabling visual inspection models to achieve state-of-the-art performance on the MVTec AD dataset.

Defect inspection is paramount within the closed-loop manufacturing system. However, existing datasets for defect inspection often lack precision and semantic granularity required for practical applications. In this paper, we introduce the Defect Spectrum, a comprehensive benchmark that offers precise, semantic-abundant, and large-scale annotations for a wide range of industrial defects. Building on four key industrial benchmarks, our dataset refines existing annotations and introduces rich semantic details, distinguishing multiple defect types within a single image. Furthermore, we introduce Defect-Gen, a two-stage diffusion-based generator designed to create high-quality and diverse defective images, even when working with limited datasets. The synthetic images generated by Defect-Gen significantly enhance the efficacy of defect inspection models. Overall, The Defect Spectrum dataset demonstrates its potential in defect inspection research, offering a solid platform for testing and refining advanced models.

The chips contained in any electronic device are manufactured over circular silicon wafers, which are monitored by inspection machines at different production stages. Inspection machines detect and locate any defect within the wafer and return a Wafer Defect Map (WDM), i.e., a list of the coordinates where defects lie, which can be considered a huge, sparse, and binary image. In normal conditions, wafers exhibit a small number of randomly distributed defects, while defects grouped in specific patterns might indicate known or novel categories of failures in the production line. Needless to say, a primary concern of semiconductor industries is to identify these patterns and intervene as soon as possible to restore normal production conditions. Here we address WDM monitoring as an open-set recognition problem to accurately classify WDM in known categories and promptly detect novel patterns. In particular, we propose a comprehensive pipeline for wafer monitoring based on a Submanifold Sparse Convolutional Network, a deep architecture designed to process sparse data at an arbitrary resolution, which is trained on the known classes. To detect novelties, we define an outlier detector based on a Gaussian Mixture Model fitted on the latent representation of the classifier. Our experiments on a real dataset of WDMs show that directly processing full-resolution WDMs by Submanifold Sparse Convolutions yields superior classification performance on known classes than traditional Convolutional Neural Networks, which require a preliminary binning to reduce the size of the binary images representing WDMs. Moreover, our solution outperforms state-of-the-art open-set recognition solutions in detecting novelties.

To efficiently deploy strong, often pre-trained feature extractors, recent Industrial Anomaly Detection and Segmentation (IADS) methods process low-resolution images, e.g., 224x224 pixels, obtained by downsampling the original input images. However, while numerous industrial applications demand the identification of both large and small defects, downsampling the input image to a low resolution may hinder a method's ability to pinpoint tiny anomalies. We propose a novel Teacher--Student paradigm to leverage strong pre-trained features while processing high-resolution input images very efficiently. The core idea concerns training two shallow MLPs (the Students) by nominal images so as to mimic the mappings between the patch embeddings induced by the self-attention layers of a frozen vision Transformer (the Teacher). Indeed, learning these mappings sets forth a challenging pretext task that small-capacity models are unlikely to accomplish on out-of-distribution data such as anomalous images. Our method can spot anomalies from high-resolution images and runs way faster than competitors, achieving state-of-the-art performance on MVTec AD and the best segmentation results on VisA. We also propose novel evaluation metrics to capture robustness to defect size, i.e., the ability to preserve good localisation from large anomalies to tiny ones. Evaluating our method also by these metrics reveals its neatly superior performance.

Precision in identifying nanometer-scale device-killer defects is crucial in both semiconductor research and development as well as in production processes. The effectiveness of existing ML-based approaches in this context is largely limited by the scarcity of data, as the production of real semiconductor wafer data for training these models involves high financial and time costs. Moreover, the existing simulation methods fall short of replicating images with identical noise characteristics, surface roughness and stochastic variations at advanced nodes. We propose a method for generating synthetic semiconductor SEM images using a diffusion model within a limited data regime. In contrast to images generated through conventional simulation methods, SEM images generated through our proposed DL method closely resemble real SEM images, replicating their noise characteristics and surface roughness adaptively. Our main contributions, which are validated on three different real semiconductor datasets, are: i) proposing a patch-based generative framework utilizing DDPM to create SEM images with intended defect classes, addressing challenges related to class-imbalance and data insufficiency, ii) demonstrating generated synthetic images closely resemble real SEM images acquired from the tool, preserving all imaging conditions and metrology characteristics without any metadata supervision, iii) demonstrating a defect detector trained on generated defect dataset, either independently or combined with a limited real dataset, can achieve similar or improved performance on real wafer SEM images during validation/testing compared to exclusive training on a real defect dataset, iv) demonstrating the ability of the proposed approach to transfer defect types, critical dimensions, and imaging conditions from one specified CD/Pitch and metrology specifications to another, thereby highlighting its versatility.

In this study, we applied the PointRend (Point-based Rendering) method to semiconductor defect segmentation. PointRend is an iterative segmentation algorithm inspired by image rendering in computer graphics, a new image segmentation method that can generate high-resolution segmentation masks. It can also be flexibly integrated into common instance segmentation meta-architecture such as Mask-RCNN and semantic meta-architecture such as FCN. We implemented a model, termed as SEMI-PointRend, to generate precise segmentation masks by applying the PointRend neural network module. In this paper, we focus on comparing the defect segmentation predictions of SEMI-PointRend and Mask-RCNN for various defect types (line-collapse, single bridge, thin bridge, multi bridge non-horizontal). We show that SEMI-PointRend can outperforms Mask R-CNN by up to 18.8% in terms of segmentation mean average precision.

As the globalization of semiconductor design and manufacturing processes continues, the demand for defect detection during integrated circuit fabrication stages is becoming increasingly critical, playing a significant role in enhancing the yield of semiconductor products. Traditional wafer map defect pattern detection methods involve manual inspection using electron microscopes to collect sample images, which are then assessed by experts for defects. This approach is labor-intensive and inefficient. Consequently, there is a pressing need to develop a model capable of automatically detecting defects as an alternative to manual operations. In this paper, we propose a method that initially employs a pre-trained VAE model to obtain the fault distribution information of the wafer map. This information serves as guidance, combined with the original image set for semi-supervised model training. During the semi-supervised training, we utilize a teacher-student network for iterative learning. The model presented in this paper is validated on the benchmark dataset WM-811K wafer dataset. The experimental results demonstrate superior classification accuracy and detection performance compared to state-of-the-art models, fulfilling the requirements for industrial applications. Compared to the original architecture, we have achieved significant performance improvement.

We aim at constructing a high performance model for defect detection that detects unknown anomalous patterns of an image without anomalous data. To this end, we propose a two-stage framework for building anomaly detectors using normal training data only. We first learn self-supervised deep representations and then build a generative one-class classifier on learned representations. We learn representations by classifying normal data from the CutPaste, a simple data augmentation strategy that cuts an image patch and pastes at a random location of a large image. Our empirical study on MVTec anomaly detection dataset demonstrates the proposed algorithm is general to be able to detect various types of real-world defects. We bring the improvement upon previous arts by 3.1 AUCs when learning representations from scratch. By transfer learning on pretrained representations on ImageNet, we achieve a new state-of-theart 96.6 AUC. Lastly, we extend the framework to learn and extract representations from patches to allow localizing defective areas without annotations during training.

Precise optical inspection in industrial applications is crucial for minimizing scrap rates and reducing the associated costs. Besides merely detecting if a product is anomalous or not, it is crucial to know the distinct type of defect, such as a bent, cut, or scratch. The ability to recognize the "exact" defect type enables automated treatments of the anomalies in modern production lines. Current methods are limited to solely detecting whether a product is defective or not without providing any insights on the defect type, nevertheless detecting and identifying multiple defects. We propose MultiADS, a zero-shot learning approach, able to perform Multi-type Anomaly Detection and Segmentation. The architecture of MultiADS comprises CLIP and extra linear layers to align the visual- and textual representation in a joint feature space. To the best of our knowledge, our proposal, is the first approach to perform a multi-type anomaly segmentation task in zero-shot learning. Contrary to the other baselines, our approach i) generates specific anomaly masks for each distinct defect type, ii) learns to distinguish defect types, and iii) simultaneously identifies multiple defect types present in an anomalous product. Additionally, our approach outperforms zero/few-shot learning SoTA methods on image-level and pixel-level anomaly detection and segmentation tasks on five commonly used datasets: MVTec-AD, Visa, MPDD, MAD and Real-IAD.

This work addresses the challenge of sub-pixel accuracy in detecting 2D local features, a cornerstone problem in computer vision. Despite the advancements brought by neural network-based methods like SuperPoint and ALIKED, these modern approaches lag behind classical ones such as SIFT in keypoint localization accuracy due to their lack of sub-pixel precision. We propose a novel network that enhances any detector with sub-pixel precision by learning an offset vector for detected features, thereby eliminating the need for designing specialized sub-pixel accurate detectors. This optimization directly minimizes test-time evaluation metrics like relative pose error. Through extensive testing with both nearest neighbors matching and the recent LightGlue matcher across various real-world datasets, our method consistently outperforms existing methods in accuracy. Moreover, it adds only around 7 ms to the time of a particular detector. The code is available at https://github.com/KimSinjeong/keypt2subpx .

Shrinking pattern dimensions leads to an increased variety of defect types in semiconductor devices. This has spurred innovation in patterning approaches such as Directed self-assembly (DSA) for which no traditional, automatic defect inspection software exists. Machine Learning-based SEM image analysis has become an increasingly popular research topic for defect inspection with supervised ML models often showing the best performance. However, little research has been done on obtaining a dataset with high-quality labels for these supervised models. In this work, we propose a method for obtaining coherent and complete labels for a dataset of hexagonal contact hole DSA patterns while requiring minimal quality control effort from a DSA expert. We show that YOLOv8, a state-of-the-art neural network, achieves defect detection precisions of more than 0.9 mAP on our final dataset which best reflects DSA expert defect labeling expectations. We discuss the strengths and limitations of our proposed labeling approach and suggest directions for future work in data-centric ML-based defect inspection.

Synthetic dataset generation in Computer Vision, particularly for industrial applications, is still underexplored. Industrial defect segmentation, for instance, requires highly accurate labels, yet acquiring such data is costly and time-consuming. To address this challenge, we propose a novel diffusion-based pipeline for generating high-fidelity industrial datasets with minimal supervision. Our approach conditions the diffusion model on enriched bounding box representations to produce precise segmentation masks, ensuring realistic and accurately localized defect synthesis. Compared to existing layout-conditioned generative methods, our approach improves defect consistency and spatial accuracy. We introduce two quantitative metrics to evaluate the effectiveness of our method and assess its impact on a downstream segmentation task trained on real and synthetic data. Our results demonstrate that diffusion-based synthesis can bridge the gap between artificial and real-world industrial data, fostering more reliable and cost-efficient segmentation models. The code is publicly available at https://github.com/covisionlab/diffusion_labeling.

We present IMDD-1M, the first large-scale Industrial Multimodal Defect Dataset comprising 1,000,000 aligned image-text pairs, designed to advance multimodal learning for manufacturing and quality inspection. IMDD-1M contains high-resolution real-world defects spanning over 60 material categories and more than 400 defect types, each accompanied by expert-verified annotations and fine-grained textual descriptions detailing defect location, severity, and contextual attributes. This dataset enables a wide spectrum of applications, including classification, segmentation, retrieval, captioning, and generative modeling. Building upon IMDD-1M, we train a diffusion-based vision-language foundation model from scratch, specifically tailored for industrial scenarios. The model serves as a generalizable foundation that can be efficiently adapted to specialized domains through lightweight fine-tuning. With less than 5% of the task-specific data required by dedicated expert models, it achieves comparable performance, highlighting the potential of data-efficient foundation model adaptation for industrial inspection and generation, paving the way for scalable, domain-adaptive, and knowledge-grounded manufacturing intelligence.

In this paper, we introduce an approach for detecting modifications in assembled printed circuit boards based on photographs taken without tight control over perspective and illumination conditions. One instance of this problem is the visual inspection of gas pumps PCBs, which can be modified by fraudsters wishing to deceive costumers or evade taxes. Given the uncontrolled environment and the huge number of possible modifications, we address the problem as a case of anomaly detection, proposing an approach that is directed towards the characteristics of that scenario, while being well-suited for other similar applications. The proposed approach employs a deep convolutional autoencoder trained to reconstruct images of an unmodified board, but which remains unable to do the same for images showing modifications. By comparing the input image with its reconstruction, it is possible to segment anomalies and modifications in a pixel-wise manner. Experiments performed on a dataset built to represent real-world situations (and which we will make publicly available) show that our approach outperforms other state-of-the-art approaches for anomaly segmentation in the considered scenario, while producing comparable results on the popular MVTec-AD dataset for a more general object anomaly detection task.

To coupe with the difficulties in the process of inspection and classification of defects in Printed Circuit Board (PCB), other researchers have proposed many methods. However, few of them published their dataset before, which hindered the introduction and comparison of new methods. In this paper, we published a synthesized PCB dataset containing 1386 images with 6 kinds of defects for the use of detection, classification and registration tasks. Besides, we proposed a reference based method to inspect and trained an end-to-end convolutional neural network to classify the defects. Unlike conventional approaches that require pixel-by-pixel processing, our method firstly locate the defects and then classify them by neural networks, which shows superior performance on our dataset.

Despite progress in vision-based inspection algorithms, real-world industrial challenges -- specifically in data availability, quality, and complex production requirements -- often remain under-addressed. We introduce the VISION Datasets, a diverse collection of 14 industrial inspection datasets, uniquely poised to meet these challenges. Unlike previous datasets, VISION brings versatility to defect detection, offering annotation masks across all splits and catering to various detection methodologies. Our datasets also feature instance-segmentation annotation, enabling precise defect identification. With a total of 18k images encompassing 44 defect types, VISION strives to mirror a wide range of real-world production scenarios. By supporting two ongoing challenge competitions on the VISION Datasets, we hope to foster further advancements in vision-based industrial inspection.

The impact of soiling on solar panels is an important and well-studied problem in renewable energy sector. In this paper, we present the first convolutional neural network (CNN) based approach for solar panel soiling and defect analysis. Our approach takes an RGB image of solar panel and environmental factors as inputs to predict power loss, soiling localization, and soiling type. In computer vision, localization is a complex task which typically requires manually labeled training data such as bounding boxes or segmentation masks. Our proposed approach consists of specialized four stages which completely avoids localization ground truth and only needs panel images with power loss labels for training. The region of impact area obtained from the predicted localization masks are classified into soiling types using the webly supervised learning. For improving localization capabilities of CNNs, we introduce a novel bi-directional input-aware fusion (BiDIAF) block that reinforces the input at different levels of CNN to learn input-specific feature maps. Our empirical study shows that BiDIAF improves the power loss prediction accuracy by about 3% and localization accuracy by about 4%. Our end-to-end model yields further improvement of about 24% on localization when learned in a weakly supervised manner. Our approach is generalizable and showed promising results on web crawled solar panel images. Our system has a frame rate of 22 fps (including all steps) on a NVIDIA TitanX GPU. Additionally, we collected first of it's kind dataset for solar panel image analysis consisting 45,000+ images.

Artificial Intelligence (AI)-driven defect inspection is pivotal in industrial manufacturing. Yet, many methods, tailored to specific pipelines, grapple with diverse product portfolios and evolving processes. Addressing this, we present the Incremental Unified Framework (IUF), which can reduce the feature conflict problem when continuously integrating new objects in the pipeline, making it advantageous in object-incremental learning scenarios. Employing a state-of-the-art transformer, we introduce Object-Aware Self-Attention (OASA) to delineate distinct semantic boundaries. Semantic Compression Loss (SCL) is integrated to optimize non-primary semantic space, enhancing network adaptability for novel objects. Additionally, we prioritize retaining the features of established objects during weight updates. Demonstrating prowess in both image and pixel-level defect inspection, our approach achieves state-of-the-art performance, proving indispensable for dynamic and scalable industrial inspections. Our code will be released at https://github.com/jqtangust/IUF.

Previous works for PCB defect detection based on image difference and image processing techniques have already achieved promising performance. However, they sometimes fall short because of the unaccounted defect patterns or over-sensitivity about some hyper-parameters. In this work, we design a deep model that accurately detects PCB defects from an input pair of a detect-free template and a defective tested image. A novel group pyramid pooling module is proposed to efficiently extract features of a large range of resolutions, which are merged by group to predict PCB defect of corresponding scales. To train the deep model, a dataset is established, namely DeepPCB, which contains 1,500 image pairs with annotations including positions of 6 common types of PCB defects. Experiment results validate the effectiveness and efficiency of the proposed model by achieving 98.6% mAP @ 62 FPS on DeepPCB dataset. This dataset is now available at: https://github.com/tangsanli5201/DeepPCB.

Existing inpainting methods have achieved promising performance in recovering defected images of specific scenes. However, filling holes involving multiple semantic categories remains challenging due to the obscure semantic boundaries and the mixture of different semantic textures. In this paper, we introduce coherence priors between the semantics and textures which make it possible to concentrate on completing separate textures in a semantic-wise manner. Specifically, we adopt a multi-scale joint optimization framework to first model the coherence priors and then accordingly interleavingly optimize image inpainting and semantic segmentation in a coarse-to-fine manner. A Semantic-Wise Attention Propagation (SWAP) module is devised to refine completed image textures across scales by exploring non-local semantic coherence, which effectively mitigates mix-up of textures. We also propose two coherence losses to constrain the consistency between the semantics and the inpainted image in terms of the overall structure and detailed textures. Experimental results demonstrate the superiority of our proposed method for challenging cases with complex holes.

Modern reconstruction techniques can effectively model complex 3D scenes from sparse 2D views. However, automatically assessing the quality of novel views and identifying artifacts is challenging due to the lack of ground truth images and the limitations of no-reference image metrics in predicting detailed artifact maps. The absence of such quality metrics hinders accurate predictions of the quality of generated views and limits the adoption of post-processing techniques, such as inpainting, to enhance reconstruction quality. In this work, we propose a new no-reference metric, Puzzle Similarity, which is designed to localize artifacts in novel views. Our approach utilizes image patch statistics from the input views to establish a scene-specific distribution that is later used to identify poorly reconstructed regions in the novel views. We test and evaluate our method in the context of 3D reconstruction; to this end, we collected a novel dataset of human quality assessment in unseen reconstructed views. Through this dataset, we demonstrate that our method can not only successfully localize artifacts in novel views, correlating with human assessment, but do so without direct references. Surprisingly, our metric outperforms both no-reference metrics and popular full-reference image metrics. We can leverage our new metric to enhance applications like automatic image restoration, guided acquisition, or 3D reconstruction from sparse inputs.

In this work we address the problem of finding reliable pixel-level correspondences under difficult imaging conditions. We propose an approach where a single convolutional neural network plays a dual role: It is simultaneously a dense feature descriptor and a feature detector. By postponing the detection to a later stage, the obtained keypoints are more stable than their traditional counterparts based on early detection of low-level structures. We show that this model can be trained using pixel correspondences extracted from readily available large-scale SfM reconstructions, without any further annotations. The proposed method obtains state-of-the-art performance on both the difficult Aachen Day-Night localization dataset and the InLoc indoor localization benchmark, as well as competitive performance on other benchmarks for image matching and 3D reconstruction.

Relying on large-scale training data with pixel-level labels, previous edge detection methods have achieved high performance. However, it is hard to manually label edges accurately, especially for large datasets, and thus the datasets inevitably contain noisy labels. This label-noise issue has been studied extensively for classification, while still remaining under-explored for edge detection. To address the label-noise issue for edge detection, this paper proposes to learn Pixel-level NoiseTransitions to model the label-corruption process. To achieve it, we develop a novel Pixel-wise Shift Learning (PSL) module to estimate the transition from clean to noisy labels as a displacement field. Exploiting the estimated noise transitions, our model, named PNT-Edge, is able to fit the prediction to clean labels. In addition, a local edge density regularization term is devised to exploit local structure information for better transition learning. This term encourages learning large shifts for the edges with complex local structures. Experiments on SBD and Cityscapes demonstrate the effectiveness of our method in relieving the impact of label noise. Codes will be available at github.

We present a new framework for Patch Distribution Modeling, PaDiM, to concurrently detect and localize anomalies in images in a one-class learning setting. PaDiM makes use of a pretrained convolutional neural network (CNN) for patch embedding, and of multivariate Gaussian distributions to get a probabilistic representation of the normal class. It also exploits correlations between the different semantic levels of CNN to better localize anomalies. PaDiM outperforms current state-of-the-art approaches for both anomaly detection and localization on the MVTec AD and STC datasets. To match real-world visual industrial inspection, we extend the evaluation protocol to assess performance of anomaly localization algorithms on non-aligned dataset. The state-of-the-art performance and low complexity of PaDiM make it a good candidate for many industrial applications.

Visual surface anomaly detection aims to detect local image regions that significantly deviate from normal appearance. Recent surface anomaly detection methods rely on generative models to accurately reconstruct the normal areas and to fail on anomalies. These methods are trained only on anomaly-free images, and often require hand-crafted post-processing steps to localize the anomalies, which prohibits optimizing the feature extraction for maximal detection capability. In addition to reconstructive approach, we cast surface anomaly detection primarily as a discriminative problem and propose a discriminatively trained reconstruction anomaly embedding model (DRAEM). The proposed method learns a joint representation of an anomalous image and its anomaly-free reconstruction, while simultaneously learning a decision boundary between normal and anomalous examples. The method enables direct anomaly localization without the need for additional complicated post-processing of the network output and can be trained using simple and general anomaly simulations. On the challenging MVTec anomaly detection dataset, DRAEM outperforms the current state-of-the-art unsupervised methods by a large margin and even delivers detection performance close to the fully-supervised methods on the widely used DAGM surface-defect detection dataset, while substantially outperforming them in localization accuracy.

Pavement defect detection faces critical challenges including limited annotated data, domain shift between training and deployment environments, and high variability in defect appearances across different road conditions. We propose RoadFusion, a framework that addresses these limitations through synthetic anomaly generation with dual-path feature adaptation. A latent diffusion model synthesizes diverse, realistic defects using text prompts and spatial masks, enabling effective training under data scarcity. Two separate feature adaptors specialize representations for normal and anomalous inputs, improving robustness to domain shift and defect variability. A lightweight discriminator learns to distinguish fine-grained defect patterns at the patch level. Evaluated on six benchmark datasets, RoadFusion achieves consistently strong performance across both classification and localization tasks, setting new state-of-the-art in multiple metrics relevant to real-world road inspection.

Printed Circuit Boards are the foundation for the functioning of any electronic device, and therefore are an essential component for various industries such as automobile, communication, computation, etc. However, one of the challenges faced by the PCB manufacturers in the process of manufacturing of the PCBs is the faulty placement of its components including missing components. In the present scenario the infrastructure required to ensure adequate quality of the PCB requires a lot of time and effort. The authors present a novel solution for detecting missing components and classifying them in a resourceful manner. The presented algorithm focuses on pixel theory and object detection, which has been used in combination to optimize the results from the given dataset.

The rapid evolution of generative technologies necessitates reliable methods for detecting AI-generated images. A critical limitation of current detectors is their failure to generalize to images from unseen generative models, as they often overfit to source-specific semantic cues rather than learning universal generative artifacts. To overcome this, we introduce a simple yet remarkably effective pixel-level mapping pre-processing step to disrupt the pixel value distribution of images and break the fragile, non-essential semantic patterns that detectors commonly exploit as shortcuts. This forces the detector to focus on more fundamental and generalizable high-frequency traces inherent to the image generation process. Through comprehensive experiments on GAN and diffusion-based generators, we show that our approach significantly boosts the cross-generator performance of state-of-the-art detectors. Extensive analysis further verifies our hypothesis that the disruption of semantic cues is the key to generalization.

Being able to spot defective parts is a critical component in large-scale industrial manufacturing. A particular challenge that we address in this work is the cold-start problem: fit a model using nominal (non-defective) example images only. While handcrafted solutions per class are possible, the goal is to build systems that work well simultaneously on many different tasks automatically. The best performing approaches combine embeddings from ImageNet models with an outlier detection model. In this paper, we extend on this line of work and propose PatchCore, which uses a maximally representative memory bank of nominal patch-features. PatchCore offers competitive inference times while achieving state-of-the-art performance for both detection and localization. On the challenging, widely used MVTec AD benchmark PatchCore achieves an image-level anomaly detection AUROC score of up to 99.6%, more than halving the error compared to the next best competitor. We further report competitive results on two additional datasets and also find competitive results in the few samples regime.^* Work done during a research internship at Amazon AWS. Code: github.com/amazon-research/patchcore-inspection.

In this paper, we propose RI3D, a novel 3DGS-based approach that harnesses the power of diffusion models to reconstruct high-quality novel views given a sparse set of input images. Our key contribution is separating the view synthesis process into two tasks of reconstructing visible regions and hallucinating missing regions, and introducing two personalized diffusion models, each tailored to one of these tasks. Specifically, one model ('repair') takes a rendered image as input and predicts the corresponding high-quality image, which in turn is used as a pseudo ground truth image to constrain the optimization. The other model ('inpainting') primarily focuses on hallucinating details in unobserved areas. To integrate these models effectively, we introduce a two-stage optimization strategy: the first stage reconstructs visible areas using the repair model, and the second stage reconstructs missing regions with the inpainting model while ensuring coherence through further optimization. Moreover, we augment the optimization with a novel Gaussian initialization method that obtains per-image depth by combining 3D-consistent and smooth depth with highly detailed relative depth. We demonstrate that by separating the process into two tasks and addressing them with the repair and inpainting models, we produce results with detailed textures in both visible and missing regions that outperform state-of-the-art approaches on a diverse set of scenes with extremely sparse inputs.

Text-to-image models give rise to workflows which often begin with an exploration step, where users sift through a large collection of generated images. The global nature of the text-to-image generation process prevents users from narrowing their exploration to a particular object in the image. In this paper, we present a technique to generate a collection of images that depicts variations in the shape of a specific object, enabling an object-level shape exploration process. Creating plausible variations is challenging as it requires control over the shape of the generated object while respecting its semantics. A particular challenge when generating object variations is accurately localizing the manipulation applied over the object's shape. We introduce a prompt-mixing technique that switches between prompts along the denoising process to attain a variety of shape choices. To localize the image-space operation, we present two techniques that use the self-attention layers in conjunction with the cross-attention layers. Moreover, we show that these localization techniques are general and effective beyond the scope of generating object variations. Extensive results and comparisons demonstrate the effectiveness of our method in generating object variations, and the competence of our localization techniques.

Power batteries are essential components in electric vehicles, where internal structural defects can pose serious safety risks. We conduct a comprehensive study on a new task, power battery detection (PBD), which aims to localize the dense endpoints of cathode and anode plates from industrial X-ray images for quality inspection. Manual inspection is inefficient and error-prone, while traditional vision algorithms struggle with densely packed plates, low contrast, scale variation, and imaging artifacts. To address this issue and drive more attention into this meaningful task, we present PBD5K, the first large-scale benchmark for this task, consisting of 5,000 X-ray images from nine battery types with fine-grained annotations and eight types of real-world visual interference. To support scalable and consistent labeling, we develop an intelligent annotation pipeline that combines image filtering, model-assisted pre-labeling, cross-verification, and layered quality evaluation. We formulate PBD as a point-level segmentation problem and propose MDCNeXt, a model designed to extract and integrate multi-dimensional structure clues including point, line, and count information from the plate itself. To improve discrimination between plates and suppress visual interference, MDCNeXt incorporates two state space modules. The first is a prompt-filtered module that learns contrastive relationships guided by task-specific prompts. The second is a density-aware reordering module that refines segmentation in regions with high plate density. In addition, we propose a distance-adaptive mask generation strategy to provide robust supervision under varying spatial distributions of anode and cathode positions. The source code and datasets will be publicly available at https://github.com/Xiaoqi-Zhao-DLUT/X-ray-PBD{PBD5K}.

We study the task of image inpainting, which is to fill in the missing region of an incomplete image with plausible contents. To this end, we propose a learning-based approach to generate visually coherent completion given a high-resolution image with missing components. In order to overcome the difficulty to directly learn the distribution of high-dimensional image data, we divide the task into inference and translation as two separate steps and model each step with a deep neural network. We also use simple heuristics to guide the propagation of local textures from the boundary to the hole. We show that, by using such techniques, inpainting reduces to the problem of learning two image-feature translation functions in much smaller space and hence easier to train. We evaluate our method on several public datasets and show that we generate results of better visual quality than previous state-of-the-art methods.

Identifying defect patterns in a wafer map during manufacturing is crucial to find the root cause of the underlying issue and provides valuable insights on improving yield in the foundry. Currently used methods use deep neural networks to identify the defects. These methods are generally very huge and have significant inference time. They also require GPU support to efficiently operate. All these issues make these models not fit for on-line prediction in the manufacturing foundry. In this paper, we propose an extremely simple yet effective technique to extract features from wafer images. The proposed method is extremely fast, intuitive, and non-parametric while being explainable. The experiment results show that the proposed pipeline outperforms conventional deep learning models. Our feature extraction requires no training or fine-tuning while preserving the relative shape and location of data points as revealed by our interpretability analysis.

Visual localization is the task of estimating a 6-DoF camera pose of a query image within a provided 3D reference map. Thanks to recent advances in various 3D sensors, 3D point clouds are becoming a more accurate and affordable option for building the reference map, but research to match the points of 3D point clouds with pixels in 2D images for visual localization remains challenging. Existing approaches that jointly learn 2D-3D feature matching suffer from low inliers due to representational differences between the two modalities, and the methods that bypass this problem into classification have an issue of poor refinement. In this work, we propose EP2P-Loc, a novel large-scale visual localization method that mitigates such appearance discrepancy and enables end-to-end training for pose estimation. To increase the number of inliers, we propose a simple algorithm to remove invisible 3D points in the image, and find all 2D-3D correspondences without keypoint detection. To reduce memory usage and search complexity, we take a coarse-to-fine approach where we extract patch-level features from 2D images, then perform 2D patch classification on each 3D point, and obtain the exact corresponding 2D pixel coordinates through positional encoding. Finally, for the first time in this task, we employ a differentiable PnP for end-to-end training. In the experiments on newly curated large-scale indoor and outdoor benchmarks based on 2D-3D-S and KITTI, we show that our method achieves the state-of-the-art performance compared to existing visual localization and image-to-point cloud registration methods.

Image restoration (IR) seeks to recover high-quality images from degraded observations caused by a wide range of factors, including noise, blur, compression, and adverse weather. While traditional IR methods have made notable progress by targeting individual degradation types, their specialization often comes at the cost of generalization, leaving them ill-equipped to handle the multifaceted distortions encountered in real-world applications. In response to this challenge, the all-in-one image restoration (AiOIR) paradigm has recently emerged, offering a unified framework that adeptly addresses multiple degradation types. These innovative models enhance the convenience and versatility by adaptively learning degradation-specific features while simultaneously leveraging shared knowledge across diverse corruptions. In this survey, we provide the first in-depth and systematic overview of AiOIR, delivering a structured taxonomy that categorizes existing methods by architectural designs, learning paradigms, and their core innovations. We systematically categorize current approaches and assess the challenges these models encounter, outlining research directions to propel this rapidly evolving field. To facilitate the evaluation of existing methods, we also consolidate widely-used datasets, evaluation protocols, and implementation practices, and compare and summarize the most advanced open-source models. As the first comprehensive review dedicated to AiOIR, this paper aims to map the conceptual landscape, synthesize prevailing techniques, and ignite further exploration toward more intelligent, unified, and adaptable visual restoration systems. A curated code repository is available at https://github.com/Harbinzzy/All-in-One-Image-Restoration-Survey.

Industrial anomaly detection achieves progress thanks to datasets such as MVTec-AD and VisA. However, they suf- fer from limitations in terms of the number of defect sam- ples, types of defects, and availability of real-world scenes. These constraints inhibit researchers from further exploring the performance of industrial detection with higher accuracy. To this end, we propose a new large-scale anomaly detection dataset called 3CAD, which is derived from real 3C produc- tion lines. Specifically, the proposed 3CAD includes eight different types of manufactured parts, totaling 27,039 high- resolution images labeled with pixel-level anomalies. The key features of 3CAD are that it covers anomalous regions of different sizes, multiple anomaly types, and the possibility of multiple anomalous regions and multiple anomaly types per anomaly image. This is the largest and first anomaly de- tection dataset dedicated to 3C product quality control for community exploration and development. Meanwhile, we in- troduce a simple yet effective framework for unsupervised anomaly detection: a Coarse-to-Fine detection paradigm with Recovery Guidance (CFRG). To detect small defect anoma- lies, the proposed CFRG utilizes a coarse-to-fine detection paradigm. Specifically, we utilize a heterogeneous distilla- tion model for coarse localization and then fine localiza- tion through a segmentation model. In addition, to better capture normal patterns, we introduce recovery features as guidance. Finally, we report the results of our CFRG frame- work and popular anomaly detection methods on the 3CAD dataset, demonstrating strong competitiveness and providing a highly challenging benchmark to promote the development of the anomaly detection field. Data and code are available: https://github.com/EnquanYang2022/3CAD.

The success of deep learning is frequently described as the ability to train all parameters of a network on a specific application in an end-to-end fashion. Yet, several design choices on the camera level, including the pixel layout of the sensor, are considered as pre-defined and fixed, and high resolution, regular pixel layouts are considered to be the most generic ones in computer vision and graphics, treating all regions of an image as equally important. While several works have considered non-uniform, \eg, hexagonal or foveated, pixel layouts in hardware and image processing, the layout has not been integrated into the end-to-end learning paradigm so far. In this work, we present the first truly end-to-end trained imaging pipeline that optimizes the size and distribution of pixels on the imaging sensor jointly with the parameters of a given neural network on a specific task. We derive an analytic, differentiable approach for the sensor layout parameterization that allows for task-specific, local varying pixel resolutions. We present two pixel layout parameterization functions: rectangular and curvilinear grid shapes that retain a regular topology. We provide a drop-in module that approximates sensor simulation given existing high-resolution images to directly connect our method with existing deep learning models. We show that network predictions benefit from learnable pixel layouts for two different downstream tasks, classification and semantic segmentation.

Anomaly detection is a crucial process in industrial manufacturing and has made significant advancements recently. However, there is a large variance between the data used in the development and the data collected by the production environment. Therefore, we present the Texture-AD benchmark based on representative texture-based anomaly detection to evaluate the effectiveness of unsupervised anomaly detection algorithms in real-world applications. This dataset includes images of 15 different cloth, 14 semiconductor wafers and 10 metal plates acquired under different optical schemes. In addition, it includes more than 10 different types of defects produced during real manufacturing processes, such as scratches, wrinkles, color variations and point defects, which are often more difficult to detect than existing datasets. All anomalous areas are provided with pixel-level annotations to facilitate comprehensive evaluation using anomaly detection models. Specifically, to adapt to diverse products in automated pipelines, we present a new evaluation method and results of baseline algorithms. The experimental results show that Texture-AD is a difficult challenge for state-of-the-art algorithms. To our knowledge, Texture-AD is the first dataset to be devoted to evaluating industrial defect detection algorithms in the real world. The dataset is available at https://XXX.

Manufacturing wafers is an intricate task involving thousands of steps. Defect Pattern Recognition (DPR) of wafer maps is crucial to find the root cause of the issue and further improving the yield in the wafer foundry. Mixed-type DPR is much more complicated compared to single-type DPR due to varied spatial features, the uncertainty of defects, and the number of defects present. To accurately predict the number of defects as well as the types of defects, we propose a novel compact deformable convolutional transformer (DC Transformer). Specifically, DC Transformer focuses on the global features present in the wafer map by virtue of learnable deformable kernels and multi-head attention to the global features. The proposed method succinctly models the internal relationship between the wafer maps and the defects. DC Transformer is evaluated on a real dataset containing 38 defect patterns. Experimental results show that DC Transformer performs exceptionally well in recognizing both single and mixed-type defects. The proposed method outperforms the current state of the models by a considerable margin

Denoising diffusion models have enabled high-quality image generation and editing. We present a method to localize the desired edit region implicit in a text instruction. We leverage InstructPix2Pix (IP2P) and identify the discrepancy between IP2P predictions with and without the instruction. This discrepancy is referred to as the relevance map. The relevance map conveys the importance of changing each pixel to achieve the edits, and is used to to guide the modifications. This guidance ensures that the irrelevant pixels remain unchanged. Relevance maps are further used to enhance the quality of text-guided editing of 3D scenes in the form of neural radiance fields. A field is trained on relevance maps of training views, denoted as the relevance field, defining the 3D region within which modifications should be made. We perform iterative updates on the training views guided by rendered relevance maps from the relevance field. Our method achieves state-of-the-art performance on both image and NeRF editing tasks. Project page: https://ashmrz.github.io/WatchYourSteps/

There has been significant progress in Masked Image Modeling (MIM). Existing MIM methods can be broadly categorized into two groups based on the reconstruction target: pixel-based and tokenizer-based approaches. The former offers a simpler pipeline and lower computational cost, but it is known to be biased toward high-frequency details. In this paper, we provide a set of empirical studies to confirm this limitation of pixel-based MIM and propose a new method that explicitly utilizes low-level features from shallow layers to aid pixel reconstruction. By incorporating this design into our base method, MAE, we reduce the wasted modeling capability of pixel-based MIM, improving its convergence and achieving non-trivial improvements across various downstream tasks. To the best of our knowledge, we are the first to systematically investigate multi-level feature fusion for isotropic architectures like the standard Vision Transformer (ViT). Notably, when applied to a smaller model (e.g., ViT-S), our method yields significant performance gains, such as 1.2\% on fine-tuning, 2.8\% on linear probing, and 2.6\% on semantic segmentation. Code and models are available at https://github.com/open-mmlab/mmpretrain.

Despite recent advancements in semantic segmentation, where and what pixels are hard to segment remains largely unexplored. Existing research only separates an image into easy and hard regions and empirically observes the latter are associated with object boundaries. In this paper, we conduct a comprehensive analysis of hard pixel errors, categorizing them into three types: false responses, merging mistakes, and displacements. Our findings reveal a quantitative association between hard pixels and aliasing, which is distortion caused by the overlapping of frequency components in the Fourier domain during downsampling. To identify the frequencies responsible for aliasing, we propose using the equivalent sampling rate to calculate the Nyquist frequency, which marks the threshold for aliasing. Then, we introduce the aliasing score as a metric to quantify the extent of aliasing. While positively correlated with the proposed aliasing score, three types of hard pixels exhibit different patterns. Here, we propose two novel de-aliasing filter (DAF) and frequency mixing (FreqMix) modules to alleviate aliasing degradation by accurately removing or adjusting frequencies higher than the Nyquist frequency. The DAF precisely removes the frequencies responsible for aliasing before downsampling, while the FreqMix dynamically selects high-frequency components within the encoder block. Experimental results demonstrate consistent improvements in semantic segmentation and low-light instance segmentation tasks. The code is available at: https://github.com/Linwei-Chen/Seg-Aliasing.

Completing a corrupted image with correct structures and reasonable textures for a mixed scene remains an elusive challenge. Since the missing hole in a mixed scene of a corrupted image often contains various semantic information, conventional two-stage approaches utilizing structural information often lead to the problem of unreliable structural prediction and ambiguous image texture generation. In this paper, we propose a Semantic Guidance and Evaluation Network (SGE-Net) to iteratively update the structural priors and the inpainted image in an interplay framework of semantics extraction and image inpainting. It utilizes semantic segmentation map as guidance in each scale of inpainting, under which location-dependent inferences are re-evaluated, and, accordingly, poorly-inferred regions are refined in subsequent scales. Extensive experiments on real-world images of mixed scenes demonstrated the superiority of our proposed method over state-of-the-art approaches, in terms of clear boundaries and photo-realistic textures.

Existing image inpainting methods often produce artifacts when dealing with large holes in real applications. To address this challenge, we propose an iterative inpainting method with a feedback mechanism. Specifically, we introduce a deep generative model which not only outputs an inpainting result but also a corresponding confidence map. Using this map as feedback, it progressively fills the hole by trusting only high-confidence pixels inside the hole at each iteration and focuses on the remaining pixels in the next iteration. As it reuses partial predictions from the previous iterations as known pixels, this process gradually improves the result. In addition, we propose a guided upsampling network to enable generation of high-resolution inpainting results. We achieve this by extending the Contextual Attention module to borrow high-resolution feature patches in the input image. Furthermore, to mimic real object removal scenarios, we collect a large object mask dataset and synthesize more realistic training data that better simulates user inputs. Experiments show that our method significantly outperforms existing methods in both quantitative and qualitative evaluations. More results and Web APP are available at https://zengxianyu.github.io/iic.

In this study, we tackle the challenging fine-grained edge detection task, which refers to predicting specific edges caused by reflectance, illumination, normal, and depth changes, respectively. Prior methods exploit multi-scale convolutional networks, which are limited in three aspects: (1) Convolutions are local operators while identifying the cause of edge formation requires looking at far away pixels. (2) Priors specific to edge cause are fixed in prediction heads. (3) Using separate networks for generic and fine-grained edge detection, and the constraint between them may be violated. To address these three issues, we propose a two-stage transformer-based network sequentially predicting generic edges and fine-grained edges, which has a global receptive field thanks to the attention mechanism. The prior knowledge of edge causes is formulated as four learnable cause tokens in a cause-aware decoder design. Furthermore, to encourage the consistency between generic edges and fine-grained edges, an edge aggregation and alignment loss is exploited. We evaluate our method on the public benchmark BSDS-RIND and several newly derived benchmarks, and achieve new state-of-the-art results. Our code, data, and models are publicly available at https://github.com/Daniellli/ECT.git.

Reliable anomaly detection in photovoltaic (PV) modules is critical for maintaining solar energy efficiency. However, developing robust computer vision models for PV inspection is constrained by the scarcity of large-scale, diverse, and balanced datasets. This study introduces PV-DDPM, a spatially conditioned denoising diffusion probabilistic model that generates anomalous electroluminescence (EL) images across four PV cell types: multi-crystalline silicon (multi-c-Si), mono-crystalline silicon (mono-c-Si), half-cut multi-c-Si, and interdigitated back contact (IBC) with dogbone interconnect. PV-DDPM enables controlled synthesis of single-defect and multi-defect scenarios by conditioning on binary masks representing structural features and defect positions. To the best of our knowledge, this is the first framework that jointly models multiple PV cell types while supporting simultaneous generation of diverse anomaly types. We also introduce E-SCDD, an enhanced version of the SCDD dataset, comprising 1,000 pixel-wise annotated EL images spanning 30 semantic classes, and 1,768 unlabeled synthetic samples. Quantitative evaluation shows our generated images achieve a Fréchet Inception Distance (FID) of 4.10 and Kernel Inception Distance (KID) of 0.0023 pm 0.0007 across all categories. Training the vision--language anomaly detection model AA-CLIP on E-SCDD, compared to the SCDD dataset, improves pixel-level AUC and average precision by 1.70 and 8.34 points, respectively.

Pixel-level segmentation of structural cracks across various scenarios remains a considerable challenge. Current methods encounter challenges in effectively modeling crack morphology and texture, facing challenges in balancing segmentation quality with low computational resource usage. To overcome these limitations, we propose a lightweight Structure-Aware Vision Mamba Network (SCSegamba), capable of generating high-quality pixel-level segmentation maps by leveraging both the morphological information and texture cues of crack pixels with minimal computational cost. Specifically, we developed a Structure-Aware Visual State Space module (SAVSS), which incorporates a lightweight Gated Bottleneck Convolution (GBC) and a Structure-Aware Scanning Strategy (SASS). The key insight of GBC lies in its effectiveness in modeling the morphological information of cracks, while the SASS enhances the perception of crack topology and texture by strengthening the continuity of semantic information between crack pixels. Experiments on crack benchmark datasets demonstrate that our method outperforms other state-of-the-art (SOTA) methods, achieving the highest performance with only 2.8M parameters. On the multi-scenario dataset, our method reached 0.8390 in F1 score and 0.8479 in mIoU. The code is available at https://github.com/Karl1109/SCSegamba.

The usage of electronic devices increases, and becomes predominant in most aspects of life. Surface Mount Technology (SMT) is the most common industrial method for manufacturing electric devices in which electrical components are mounted directly onto the surface of a Printed Circuit Board (PCB). Although the expansion of electronic devices affects our lives in a productive way, failures or defects in the manufacturing procedure of those devices might also be counterproductive and even harmful in some cases. It is therefore desired and sometimes crucial to ensure zero-defect quality in electronic devices and their production. While traditional Image Processing (IP) techniques are not sufficient to produce a complete solution, other promising methods like Deep Learning (DL) might also be challenging for PCB inspection, mainly because such methods require big adequate datasets which are missing, not available or not updated in the rapidly growing field of PCBs. Thus, PCB inspection is conventionally performed manually by human experts. Unsupervised Learning (UL) methods may potentially be suitable for PCB inspection, having learning capabilities on the one hand, while not relying on large datasets on the other. In this paper, we introduce ChangeChip, an automated and integrated change detection system for defect detection in PCBs, from soldering defects to missing or misaligned electronic elements, based on Computer Vision (CV) and UL. We achieve good quality defect detection by applying an unsupervised change detection between images of a golden PCB (reference) and the inspected PCB under various setting. In this work, we also present CD-PCB, a synthesized labeled dataset of 20 pairs of PCB images for evaluation of defect detection algorithms.

Quality control is of vital importance during electronics production. As the methods of producing electronic circuits improve, there is an increasing chance of solder defects during assembling the printed circuit board (PCB). Many technologies have been incorporated for inspecting failed soldering, such as X-ray imaging, optical imaging, and thermal imaging. With some advanced algorithms, the new technologies are expected to control the production quality based on the digital images. However, current algorithms sometimes are not accurate enough to meet the quality control. Specialists are needed to do a follow-up checking. For automated X-ray inspection, joint of interest on the X-ray image is located by region of interest (ROI) and inspected by some algorithms. Some incorrect ROIs deteriorate the inspection algorithm. The high dimension of X-ray images and the varying sizes of image dimensions also challenge the inspection algorithms. On the other hand, recent advances on deep learning shed light on image-based tasks and are competitive to human levels. In this paper, deep learning is incorporated in X-ray imaging based quality control during PCB quality inspection. Two artificial intelligence (AI) based models are proposed and compared for joint defect detection. The noised ROI problem and the varying sizes of imaging dimension problem are addressed. The efficacy of the proposed methods are verified through experimenting on a real-world 3D X-ray dataset. By incorporating the proposed methods, specialist inspection workload is largely saved.

We propose MVSplat, an efficient feed-forward 3D Gaussian Splatting model learned from sparse multi-view images. To accurately localize the Gaussian centers, we propose to build a cost volume representation via plane sweeping in the 3D space, where the cross-view feature similarities stored in the cost volume can provide valuable geometry cues to the estimation of depth. We learn the Gaussian primitives' opacities, covariances, and spherical harmonics coefficients jointly with the Gaussian centers while only relying on photometric supervision. We demonstrate the importance of the cost volume representation in learning feed-forward Gaussian Splatting models via extensive experimental evaluations. On the large-scale RealEstate10K and ACID benchmarks, our model achieves state-of-the-art performance with the fastest feed-forward inference speed (22 fps). Compared to the latest state-of-the-art method pixelSplat, our model uses 10times fewer parameters and infers more than 2times faster while providing higher appearance and geometry quality as well as better cross-dataset generalization.

Image inpainting is the task of plausibly restoring missing pixels within a hole region that is to be removed from a target image. Most existing technologies exploit patch similarities within the image, or leverage large-scale training data to fill the hole using learned semantic and texture information. However, due to the ill-posed nature of the inpainting task, such methods struggle to complete larger holes containing complicated scenes. In this paper, we propose TransFill, a multi-homography transformed fusion method to fill the hole by referring to another source image that shares scene contents with the target image. We first align the source image to the target image by estimating multiple homographies guided by different depth levels. We then learn to adjust the color and apply a pixel-level warping to each homography-warped source image to make it more consistent with the target. Finally, a pixel-level fusion module is learned to selectively merge the different proposals. Our method achieves state-of-the-art performance on pairs of images across a variety of wide baselines and color differences, and generalizes to user-provided image pairs.

We present the first text-based image editing approach for object parts based on pre-trained diffusion models. Diffusion-based image editing approaches capitalized on the deep understanding of diffusion models of image semantics to perform a variety of edits. However, existing diffusion models lack sufficient understanding of many object parts, hindering fine-grained edits requested by users. To address this, we propose to expand the knowledge of pre-trained diffusion models to allow them to understand various object parts, enabling them to perform fine-grained edits. We achieve this by learning special textual tokens that correspond to different object parts through an efficient token optimization process. These tokens are optimized to produce reliable localization masks at each inference step to localize the editing region. Leveraging these masks, we design feature-blending and adaptive thresholding strategies to execute the edits seamlessly. To evaluate our approach, we establish a benchmark and an evaluation protocol for part editing. Experiments show that our approach outperforms existing editing methods on all metrics and is preferred by users 77-90% of the time in conducted user studies.

Detecting surface anomalies of industrial materials poses a significant challenge within a myriad of industrial manufacturing processes. In recent times, various methodologies have emerged, capitalizing on the advantages of employing a network pre-trained on natural images for the extraction of representative features. Subsequently, these features are subjected to processing through a diverse range of techniques including memory banks, normalizing flow, and knowledge distillation, which have exhibited exceptional accuracy. This paper revisits approaches based on pre-trained features by introducing a novel method centered on target-specific embedding. To capture the most representative features of the texture under consideration, we employ a variant of a contrastive training procedure that incorporates both artificially generated defective samples and anomaly-free samples during training. Exploiting the intrinsic properties of surfaces, we derived a meaningful representation from the defect-free samples during training, facilitating a straightforward yet effective calculation of anomaly scores. The experiments conducted on the MVTEC AD and TILDA datasets demonstrate the competitiveness of our approach compared to state-of-the-art methods.

This survey paper offers a comprehensive review of methodologies utilizing machine learning (ML) classification techniques for identifying wafer defects in semiconductor manufacturing. Despite the growing body of research demonstrating the effectiveness of ML in wafer defect identification, there is a noticeable absence of comprehensive reviews on this subject. This survey attempts to fill this void by amalgamating available literature and providing an in-depth analysis of the advantages, limitations, and potential applications of various ML classification algorithms in the realm of wafer defect detection. An innovative taxonomy of methodologies that we present provides a detailed classification of algorithms into more refined categories and techniques. This taxonomy follows a three-tier structure, starting from broad methodology categories and ending with specific techniques. It aids researchers in comprehending the complex relationships between different algorithms and their techniques. We employ a rigorous empirical and experimental evaluation to rank these varying techniques. For the empirical evaluation, we assess techniques based on a set of five criteria. The experimental evaluation ranks the algorithms employing the same techniques, sub-categories, and categories. Also the paper illuminates the future prospects of ML classification techniques for wafer defect identification, underscoring potential advancements and opportunities for further research in this field

In real-world scenarios, image impairments often manifest as composite degradations, presenting a complex interplay of elements such as low light, haze, rain, and snow. Despite this reality, existing restoration methods typically target isolated degradation types, thereby falling short in environments where multiple degrading factors coexist. To bridge this gap, our study proposes a versatile imaging model that consolidates four physical corruption paradigms to accurately represent complex, composite degradation scenarios. In this context, we propose OneRestore, a novel transformer-based framework designed for adaptive, controllable scene restoration. The proposed framework leverages a unique cross-attention mechanism, merging degraded scene descriptors with image features, allowing for nuanced restoration. Our model allows versatile input scene descriptors, ranging from manual text embeddings to automatic extractions based on visual attributes. Our methodology is further enhanced through a composite degradation restoration loss, using extra degraded images as negative samples to fortify model constraints. Comparative results on synthetic and real-world datasets demonstrate OneRestore as a superior solution, significantly advancing the state-of-the-art in addressing complex, composite degradations.

Although recent methods have tried to introduce large multimodal models (LMMs) into industrial anomaly detection (IAD), their generalization in the IAD field is far inferior to that for general purposes. We summarize the main reasons for this gap into two aspects. On one hand, general-purpose LMMs lack cognition of defects in the visual modality, thereby failing to sufficiently focus on defect areas. Therefore, we propose to modify the AnyRes structure of the LLaVA model, providing the potential anomalous areas identified by existing IAD models to the LMMs. On the other hand, existing methods mainly focus on identifying defects by learning defect patterns or comparing with normal samples, yet they fall short of understanding the causes of these defects. Considering that the generation of defects is closely related to the manufacturing process, we propose a manufacturing-driven IAD paradigm. An instruction-tuning dataset for IAD (InstructIAD) and a data organization approach for Chain-of-Thought with manufacturing (CoT-M) are designed to leverage the manufacturing process for IAD. Based on the above two modifications, we present Triad, a novel LMM-based method incorporating an expert-guided region-of-interest tokenizer and manufacturing process for industrial anomaly detection. Extensive experiments show that our Triad not only demonstrates competitive performance against current LMMs but also achieves further improved accuracy when equipped with manufacturing processes. Source code, training data, and pre-trained models will be publicly available at https://github.com/tzjtatata/Triad.

We introduce pixelSplat, a feed-forward model that learns to reconstruct 3D radiance fields parameterized by 3D Gaussian primitives from pairs of images. Our model features real-time and memory-efficient rendering for scalable training as well as fast 3D reconstruction at inference time. To overcome local minima inherent to sparse and locally supported representations, we predict a dense probability distribution over 3D and sample Gaussian means from that probability distribution. We make this sampling operation differentiable via a reparameterization trick, allowing us to back-propagate gradients through the Gaussian splatting representation. We benchmark our method on wide-baseline novel view synthesis on the real-world RealEstate10k and ACID datasets, where we outperform state-of-the-art light field transformers and accelerate rendering by 2.5 orders of magnitude while reconstructing an interpretable and editable 3D radiance field.

Large vision-language models (LVLMs) are markedly proficient in deriving visual representations guided by natural language. Recent explorations have utilized LVLMs to tackle zero-shot visual anomaly detection (VAD) challenges by pairing images with textual descriptions indicative of normal and abnormal conditions, referred to as anomaly prompts. However, existing approaches depend on static anomaly prompts that are prone to cross-semantic ambiguity, and prioritize global image-level representations over crucial local pixel-level image-to-text alignment that is necessary for accurate anomaly localization. In this paper, we present ALFA, a training-free approach designed to address these challenges via a unified model. We propose a run-time prompt adaptation strategy, which first generates informative anomaly prompts to leverage the capabilities of a large language model (LLM). This strategy is enhanced by a contextual scoring mechanism for per-image anomaly prompt adaptation and cross-semantic ambiguity mitigation. We further introduce a novel fine-grained aligner to fuse local pixel-level semantics for precise anomaly localization, by projecting the image-text alignment from global to local semantic spaces. Extensive evaluations on MVTec and VisA datasets confirm ALFA's effectiveness in harnessing the language potential for zero-shot VAD, achieving significant PRO improvements of 12.1% on MVTec and 8.9% on VisA compared to state-of-the-art approaches.

The rapid growth of high-resolution, meticulously crafted AI-generated images poses a significant challenge to existing detection methods, which are often trained and evaluated on low-resolution, automatically generated datasets that do not align with the complexities of high-resolution scenarios. A common practice is to resize or center-crop high-resolution images to fit standard network inputs. However, without full coverage of all pixels, such strategies risk either obscuring subtle, high-frequency artifacts or discarding information from uncovered regions, leading to input information loss. In this paper, we introduce the High-Resolution Detail-Aggregation Network (HiDA-Net), a novel framework that ensures no pixel is left behind. We use the Feature Aggregation Module (FAM), which fuses features from multiple full-resolution local tiles with a down-sampled global view of the image. These local features are aggregated and fused with global representations for final prediction, ensuring that native-resolution details are preserved and utilized for detection. To enhance robustness against challenges such as localized AI manipulations and compression, we introduce Token-wise Forgery Localization (TFL) module for fine-grained spatial sensitivity and JPEG Quality Factor Estimation (QFE) module to disentangle generative artifacts from compression noise explicitly. Furthermore, to facilitate future research, we introduce HiRes-50K, a new challenging benchmark consisting of 50,568 images with up to 64 megapixels. Extensive experiments show that HiDA-Net achieves state-of-the-art, increasing accuracy by over 13% on the challenging Chameleon dataset and 10% on our HiRes-50K.

In spite of recent progress, image diffusion models still produce artifacts. A common solution is to leverage the feedback provided by quality assessment systems or human annotators to optimize the model, where images are generally rated in their entirety. In this work, we believe problem-solving starts with identification, yielding the request that the model should be aware of not just the presence of defects in an image, but their specific locations. Motivated by this, we propose DiffDoctor, a two-stage pipeline to assist image diffusion models in generating fewer artifacts. Concretely, the first stage targets developing a robust artifact detector, for which we collect a dataset of over 1M flawed synthesized images and set up an efficient human-in-the-loop annotation process, incorporating a carefully designed class-balance strategy. The learned artifact detector is then involved in the second stage to optimize the diffusion model by providing pixel-level feedback. Extensive experiments on text-to-image diffusion models demonstrate the effectiveness of our artifact detector as well as the soundness of our diagnose-then-treat design.

In this paper we present TruFor, a forensic framework that can be applied to a large variety of image manipulation methods, from classic cheapfakes to more recent manipulations based on deep learning. We rely on the extraction of both high-level and low-level traces through a transformer-based fusion architecture that combines the RGB image and a learned noise-sensitive fingerprint. The latter learns to embed the artifacts related to the camera internal and external processing by training only on real data in a self-supervised manner. Forgeries are detected as deviations from the expected regular pattern that characterizes each pristine image. Looking for anomalies makes the approach able to robustly detect a variety of local manipulations, ensuring generalization. In addition to a pixel-level localization map and a whole-image integrity score, our approach outputs a reliability map that highlights areas where localization predictions may be error-prone. This is particularly important in forensic applications in order to reduce false alarms and allow for a large scale analysis. Extensive experiments on several datasets show that our method is able to reliably detect and localize both cheapfakes and deepfakes manipulations outperforming state-of-the-art works. Code is publicly available at https://grip-unina.github.io/TruFor/

In this work, we introduce a generative approach for pose-free reconstruction of 360^{circ} scenes from a limited number of uncalibrated 2D images. Pose-free scene reconstruction from incomplete, unposed observations is usually regularized with depth estimation or 3D foundational priors. While recent advances have enabled sparse-view reconstruction of unbounded scenes with known camera poses using diffusion priors, these methods rely on explicit camera embeddings for extrapolating unobserved regions. This reliance limits their application in pose-free settings, where view-specific data is only implicitly available. To address this, we propose an instruction-following RGBD diffusion model designed to inpaint missing details and remove artifacts in novel view renders and depth maps of a 3D scene. We also propose a novel confidence measure for Gaussian representations to allow for better detection of these artifacts. By progressively integrating these novel views in a Gaussian-SLAM-inspired process, we achieve a multi-view-consistent Gaussian representation. Evaluations on the MipNeRF360 dataset demonstrate that our method surpasses existing pose-free techniques and performs competitively with state-of-the-art posed reconstruction methods in complex 360^{circ} scenes.

In anomaly segmentation for complex driving scenes, state-of-the-art approaches utilize anomaly scoring functions to calculate anomaly scores. For these functions, accurately predicting the logits of inlier classes for each pixel is crucial for precisely inferring the anomaly score. However, in real-world driving scenarios, the diversity of scenes often results in distorted manifolds of pixel embeddings in the space. This effect is not conducive to directly using the pixel embeddings for the logit prediction during inference, a concern overlooked by existing methods. To address this problem, we propose a novel method called Random Walk on Pixel Manifolds (RWPM). RWPM utilizes random walks to reveal the intrinsic relationships among pixels to refine the pixel embeddings. The refined pixel embeddings alleviate the distortion of manifolds, improving the accuracy of anomaly scores. Our extensive experiments show that RWPM consistently improve the performance of the existing anomaly segmentation methods and achieve the best results. Code is available at: https://github.com/ZelongZeng/RWPM.

The aim of surface defect detection is to identify and localise abnormal regions on the surfaces of captured objects, a task that's increasingly demanded across various industries. Current approaches frequently fail to fulfil the extensive demands of these industries, which encompass high performance, consistency, and fast operation, along with the capacity to leverage the entirety of the available training data. Addressing these gaps, we introduce SuperSimpleNet, an innovative discriminative model that evolved from SimpleNet. This advanced model significantly enhances its predecessor's training consistency, inference time, as well as detection performance. SuperSimpleNet operates in an unsupervised manner using only normal training images but also benefits from labelled abnormal training images when they are available. SuperSimpleNet achieves state-of-the-art results in both the supervised and the unsupervised settings, as demonstrated by experiments across four challenging benchmark datasets. Code: https://github.com/blaz-r/SuperSimpleNet .

Semantic segmentation models classify pixels into a set of known (``in-distribution'') visual classes. When deployed in an open world, the reliability of these models depends on their ability not only to classify in-distribution pixels but also to detect out-of-distribution (OoD) pixels. Historically, the poor OoD detection performance of these models has motivated the design of methods based on model re-training using synthetic training images that include OoD visual objects. Although successful, these re-trained methods have two issues: 1) their in-distribution segmentation accuracy may drop during re-training, and 2) their OoD detection accuracy does not generalise well to new contexts (e.g., country surroundings) outside the training set (e.g., city surroundings). In this paper, we mitigate these issues with: (i) a new residual pattern learning (RPL) module that assists the segmentation model to detect OoD pixels without affecting the inlier segmentation performance; and (ii) a novel context-robust contrastive learning (CoroCL) that enforces RPL to robustly detect OoD pixels among various contexts. Our approach improves by around 10\% FPR and 7\% AuPRC the previous state-of-the-art in Fishyscapes, Segment-Me-If-You-Can, and RoadAnomaly datasets. Our code is available at: https://github.com/yyliu01/RPL.

We describe a method to parse a complex, cluttered indoor scene into primitives which offer a parsimonious abstraction of scene structure. Our primitives are simple convexes. Our method uses a learned regression procedure to parse a scene into a fixed number of convexes from RGBD input, and can optionally accept segmentations to improve the decomposition. The result is then polished with a descent method which adjusts the convexes to produce a very good fit, and greedily removes superfluous primitives. Because the entire scene is parsed, we can evaluate using traditional depth, normal, and segmentation error metrics. Our evaluation procedure demonstrates that the error from our primitive representation is comparable to that of predicting depth from a single image.

In industrial anomaly detection (IAD), accurately identifying defects amidst diverse anomalies and under varying imaging conditions remains a significant challenge. Traditional approaches often struggle with high false-positive rates, frequently misclassifying normal shadows and surface deformations as defects, an issue that becomes particularly pronounced in products with complex and intricate surface features. To address these challenges, we introduce PA-CLIP, a zero-shot anomaly detection method that reduces background noise and enhances defect detection through a pseudo-anomaly-based framework. The proposed method integrates a multiscale feature aggregation strategy for capturing detailed global and local information, two memory banks for distinguishing background information, including normal patterns and pseudo-anomalies, from true anomaly features, and a decision-making module designed to minimize false positives caused by environmental variations while maintaining high defect sensitivity. Demonstrated on the MVTec AD and VisA datasets, PA-CLIP outperforms existing zero-shot methods, providing a robust solution for industrial defect detection.

The paper explores the industrial multimodal Anomaly Detection (AD) task, which exploits point clouds and RGB images to localize anomalies. We introduce a novel light and fast framework that learns to map features from one modality to the other on nominal samples. At test time, anomalies are detected by pinpointing inconsistencies between observed and mapped features. Extensive experiments show that our approach achieves state-of-the-art detection and segmentation performance in both the standard and few-shot settings on the MVTec 3D-AD dataset while achieving faster inference and occupying less memory than previous multimodal AD methods. Moreover, we propose a layer-pruning technique to improve memory and time efficiency with a marginal sacrifice in performance.

In this work, we introduce a challenging image restoration task, referred to as SuperInpaint, which aims to reconstruct missing regions in low-resolution images and generate completed images with arbitrarily higher resolutions. We have found that this task cannot be effectively addressed by stacking state-of-the-art super-resolution and image inpainting methods as they amplify each other's flaws, leading to noticeable artifacts. To overcome these limitations, we propose the detail-enhanced attentional implicit representation (DEAR) that can achieve SuperInpaint with a single model, resulting in high-quality completed images with arbitrary resolutions. Specifically, we use a deep convolutional network to extract the latent embedding of an input image and then enhance the high-frequency components of the latent embedding via an adaptive high-pass filter. This leads to detail-enhanced semantic embedding. We further feed the semantic embedding into an unmask-attentional module that suppresses embeddings from ineffective masked pixels. Additionally, we extract a pixel-wise importance map that indicates which pixels should be used for image reconstruction. Given the coordinates of a pixel we want to reconstruct, we first collect its neighboring pixels in the input image and extract their detail-enhanced semantic embeddings, unmask-attentional semantic embeddings, importance values, and spatial distances to the desired pixel. Then, we feed all the above terms into an implicit representation and generate the color of the specified pixel. To evaluate our method, we extend three existing datasets for this new task and build 18 meaningful baselines using SOTA inpainting and super-resolution methods. Extensive experimental results demonstrate that our method outperforms all existing methods by a significant margin on four widely used metrics.

Effective image restoration with large-size corruptions, such as blind image inpainting, entails precise detection of corruption region masks which remains extremely challenging due to diverse shapes and patterns of corruptions. In this work, we present a novel method for automatic corruption detection, which allows for blind corruption restoration without known corruption masks. Specifically, we develop a hierarchical contrastive learning framework to detect corrupted regions by capturing the intrinsic semantic distinctions between corrupted and uncorrupted regions. In particular, our model detects the corrupted mask in a coarse-to-fine manner by first predicting a coarse mask by contrastive learning in low-resolution feature space and then refines the uncertain area of the mask by high-resolution contrastive learning. A specialized hierarchical interaction mechanism is designed to facilitate the knowledge propagation of contrastive learning in different scales, boosting the modeling performance substantially. The detected multi-scale corruption masks are then leveraged to guide the corruption restoration. Detecting corrupted regions by learning the contrastive distinctions rather than the semantic patterns of corruptions, our model has well generalization ability across different corruption patterns. Extensive experiments demonstrate following merits of our model: 1) the superior performance over other methods on both corruption detection and various image restoration tasks including blind inpainting and watermark removal, and 2) strong generalization across different corruption patterns such as graffiti, random noise or other image content. Codes and trained weights are available at https://github.com/xyfJASON/HCL .

This paper presents Pixel-Perfect Depth, a monocular depth estimation model based on pixel-space diffusion generation that produces high-quality, flying-pixel-free point clouds from estimated depth maps. Current generative depth estimation models fine-tune Stable Diffusion and achieve impressive performance. However, they require a VAE to compress depth maps into latent space, which inevitably introduces flying pixels at edges and details. Our model addresses this challenge by directly performing diffusion generation in the pixel space, avoiding VAE-induced artifacts. To overcome the high complexity associated with pixel-space generation, we introduce two novel designs: 1) Semantics-Prompted Diffusion Transformers (SP-DiT), which incorporate semantic representations from vision foundation models into DiT to prompt the diffusion process, thereby preserving global semantic consistency while enhancing fine-grained visual details; and 2) Cascade DiT Design that progressively increases the number of tokens to further enhance efficiency and accuracy. Our model achieves the best performance among all published generative models across five benchmarks, and significantly outperforms all other models in edge-aware point cloud evaluation.

With recent generative models facilitating photo-realistic image synthesis, the proliferation of synthetic images has also engendered certain negative impacts on social platforms, thereby raising an urgent imperative to develop effective detectors. Current synthetic image detection (SID) pipelines are primarily dedicated to crafting universal artifact features, accompanied by an oversight about SID training paradigm. In this paper, we re-examine the SID problem and identify two prevalent biases in current training paradigms, i.e., weakened artifact features and overfitted artifact features. Meanwhile, we discover that the imaging mechanism of synthetic images contributes to heightened local correlations among pixels, suggesting that detectors should be equipped with local awareness. In this light, we propose SAFE, a lightweight and effective detector with three simple image transformations. Firstly, for weakened artifact features, we substitute the down-sampling operator with the crop operator in image pre-processing to help circumvent artifact distortion. Secondly, for overfitted artifact features, we include ColorJitter and RandomRotation as additional data augmentations, to help alleviate irrelevant biases from color discrepancies and semantic differences in limited training samples. Thirdly, for local awareness, we propose a patch-based random masking strategy tailored for SID, forcing the detector to focus on local regions at training. Comparative experiments are conducted on an open-world dataset, comprising synthetic images generated by 26 distinct generative models. Our pipeline achieves a new state-of-the-art performance, with remarkable improvements of 4.5% in accuracy and 2.9% in average precision against existing methods. Our code is available at: https://github.com/Ouxiang-Li/SAFE.

Gaussian Splatting (GS), a recent technique for converting discrete points into continuous spatial representations, has shown promising results in 3D scene modeling and 2D image super-resolution. In this paper, we explore its untapped potential for image inpainting, which demands both locally coherent pixel synthesis and globally consistent semantic restoration. We propose the first image inpainting framework based on 2D Gaussian Splatting, which encodes incomplete images into a continuous field of 2D Gaussian splat coefficients and reconstructs the final image via a differentiable rasterization process. The continuous rendering paradigm of GS inherently promotes pixel-level coherence in the inpainted results. To improve efficiency and scalability, we introduce a patch-wise rasterization strategy that reduces memory overhead and accelerates inference. For global semantic consistency, we incorporate features from a pretrained DINO model. We observe that DINO's global features are naturally robust to small missing regions and can be effectively adapted to guide semantic alignment in large-mask scenarios, ensuring that the inpainted content remains contextually consistent with the surrounding scene. Extensive experiments on standard benchmarks demonstrate that our method achieves competitive performance in both quantitative metrics and perceptual quality, establishing a new direction for applying Gaussian Splatting to 2D image processing.

Automatic detecting anomalous regions in images of objects or textures without priors of the anomalies is challenging, especially when the anomalies appear in very small areas of the images, making difficult-to-detect visual variations, such as defects on manufacturing products. This paper proposes an effective unsupervised anomaly segmentation approach that can detect and segment out the anomalies in small and confined regions of images. Concretely, we develop a multi-scale regional feature generator that can generate multiple spatial context-aware representations from pre-trained deep convolutional networks for every subregion of an image. The regional representations not only describe the local characteristics of corresponding regions but also encode their multiple spatial context information, making them discriminative and very beneficial for anomaly detection. Leveraging these descriptive regional features, we then design a deep yet efficient convolutional autoencoder and detect anomalous regions within images via fast feature reconstruction. Our method is simple yet effective and efficient. It advances the state-of-the-art performances on several benchmark datasets and shows great potential for real applications.

Deep Convolutional Neural Networks (DCNNs) have recently shown state of the art performance in high level vision tasks, such as image classification and object detection. This work brings together methods from DCNNs and probabilistic graphical models for addressing the task of pixel-level classification (also called "semantic image segmentation"). We show that responses at the final layer of DCNNs are not sufficiently localized for accurate object segmentation. This is due to the very invariance properties that make DCNNs good for high level tasks. We overcome this poor localization property of deep networks by combining the responses at the final DCNN layer with a fully connected Conditional Random Field (CRF). Qualitatively, our "DeepLab" system is able to localize segment boundaries at a level of accuracy which is beyond previous methods. Quantitatively, our method sets the new state-of-art at the PASCAL VOC-2012 semantic image segmentation task, reaching 71.6% IOU accuracy in the test set. We show how these results can be obtained efficiently: Careful network re-purposing and a novel application of the 'hole' algorithm from the wavelet community allow dense computation of neural net responses at 8 frames per second on a modern GPU.

Color constancy methods often struggle to generalize across different camera sensors due to varying spectral sensitivities. We present GCC, which leverages diffusion models to inpaint color checkers into images for illumination estimation. Our key innovations include (1) a single-step deterministic inference approach that inpaints color checkers reflecting scene illumination, (2) a Laplacian decomposition technique that preserves checker structure while allowing illumination-dependent color adaptation, and (3) a mask-based data augmentation strategy for handling imprecise color checker annotations. GCC demonstrates superior robustness in cross-camera scenarios, achieving state-of-the-art worst-25% error rates of 5.15{\deg} and 4.32{\deg} in bi-directional evaluations. These results highlight our method's stability and generalization capability across different camera characteristics without requiring sensor-specific training, making it a versatile solution for real-world applications.

Vision Language Models (VLMs) are increasingly adopted for AI-generated images (AIGI) detection, yet converting VLMs into detectors requires substantial resource, while the resulting models still exhibit severe hallucinations. To probe the core issue, we conduct an empirical analysis and observe two characteristic behaviors: (i) fine-tuning VLMs on high-level semantic supervision strengthens semantic discrimination and well generalize to unseen data; (ii) fine-tuning VLMs on low-level pixel-artifact supervision yields poor transfer. We attribute VLMs' underperformance to task-model misalignment: semantics-oriented VLMs inherently lack sensitivity to fine-grained pixel artifacts, and semantically non-discriminative pixel artifacts thus exceeds their inductive biases. In contrast, we observe that conventional pixel-artifact detectors capture low-level pixel artifacts yet exhibit limited semantic awareness relative to VLMs, highlighting that distinct models are better matched to distinct tasks. In this paper, we formalize AIGI detection as two complementary tasks--semantic consistency checking and pixel-artifact detection--and show that neglecting either induces systematic blind spots. Guided by this view, we introduce the Task-Model Alignment principle and instantiate it as a two-branch detector, AlignGemini, comprising a VLM fine-tuned exclusively with pure semantic supervision and a pixel-artifact expert trained exclusively with pure pixel-artifact supervision. By enforcing orthogonal supervision on two simplified datasets, each branch trains to its strengths, producing complementary discrimination over semantic and pixel cues. On five in-the-wild benchmarks, AlignGemini delivers a +9.5 gain in average accuracy, supporting task-model alignment as an effective path to generalizable AIGI detection.

Wires and powerlines are common visual distractions that often undermine the aesthetics of photographs. The manual process of precisely segmenting and removing them is extremely tedious and may take up hours, especially on high-resolution photos where wires may span the entire space. In this paper, we present an automatic wire clean-up system that eases the process of wire segmentation and removal/inpainting to within a few seconds. We observe several unique challenges: wires are thin, lengthy, and sparse. These are rare properties of subjects that common segmentation tasks cannot handle, especially in high-resolution images. We thus propose a two-stage method that leverages both global and local contexts to accurately segment wires in high-resolution images efficiently, and a tile-based inpainting strategy to remove the wires given our predicted segmentation masks. We also introduce the first wire segmentation benchmark dataset, WireSegHR. Finally, we demonstrate quantitatively and qualitatively that our wire clean-up system enables fully automated wire removal with great generalization to various wire appearances.

Image inpainting is a fundamental research area between image editing and image generation. Recent state-of-the-art (SOTA) methods have explored novel attention mechanisms, lightweight architectures, and context-aware modeling, demonstrating impressive performance. However, they often struggle with complex structure (e.g., texture, shape, spatial relations) and semantics (e.g., color consistency, object restoration, and logical correctness), leading to artifacts and inappropriate generation. To address this challenge, we design a simple yet effective inpainting paradigm called latent categories guidance, and further propose a diffusion-based model named PixelHacker. Specifically, we first construct a large dataset containing 14 million image-mask pairs by annotating foreground and background (potential 116 and 21 categories, respectively). Then, we encode potential foreground and background representations separately through two fixed-size embeddings, and intermittently inject these features into the denoising process via linear attention. Finally, by pre-training on our dataset and fine-tuning on open-source benchmarks, we obtain PixelHacker. Extensive experiments show that PixelHacker comprehensively outperforms the SOTA on a wide range of datasets (Places2, CelebA-HQ, and FFHQ) and exhibits remarkable consistency in both structure and semantics. Project page at https://hustvl.github.io/PixelHacker.

The practical deployment of Visual Anomaly Detection (VAD) systems is hindered by their sensitivity to real-world imaging variations, particularly the complex interplay between viewpoint and illumination which drastically alters defect visibility. Current benchmarks largely overlook this critical challenge. We introduce Multi-View Multi-Illumination Anomaly Detection (M2AD), a new large-scale benchmark comprising 119,880 high-resolution images designed explicitly to probe VAD robustness under such interacting conditions. By systematically capturing 999 specimens across 10 categories using 12 synchronized views and 10 illumination settings (120 configurations total), M2AD enables rigorous evaluation. We establish two evaluation protocols: M2AD-Synergy tests the ability to fuse information across diverse configurations, and M2AD-Invariant measures single-image robustness against realistic view-illumination effects. Our extensive benchmarking shows that state-of-the-art VAD methods struggle significantly on M2AD, demonstrating the profound challenge posed by view-illumination interplay. This benchmark serves as an essential tool for developing and validating VAD methods capable of overcoming real-world complexities. Our full dataset and test suite will be released at https://hustcyq.github.io/M2AD to facilitate the field.

Few-shot anomaly detection (FSAD) has emerged as a crucial yet challenging task in industrial inspection, where normal distribution modeling must be accomplished with only a few normal images. While existing approaches typically employ multi-modal foundation models combining language and vision modalities for prompt-guided anomaly detection, these methods often demand sophisticated prompt engineering and extensive manual tuning. In this paper, we demonstrate that a straightforward nearest-neighbor search framework can surpass state-of-the-art performance in both single-class and multi-class FSAD scenarios. Our proposed method, VisionAD, consists of four simple yet essential components: (1) scalable vision foundation models that extract universal and discriminative features; (2) dual augmentation strategies - support augmentation to enhance feature matching adaptability and query augmentation to address the oversights of single-view prediction; (3) multi-layer feature integration that captures both low-frequency global context and high-frequency local details with minimal computational overhead; and (4) a class-aware visual memory bank enabling efficient one-for-all multi-class detection. Extensive evaluations across MVTec-AD, VisA, and Real-IAD benchmarks demonstrate VisionAD's exceptional performance. Using only 1 normal images as support, our method achieves remarkable image-level AUROC scores of 97.4%, 94.8%, and 70.8% respectively, outperforming current state-of-the-art approaches by significant margins (+1.6%, +3.2%, and +1.4%). The training-free nature and superior few-shot capabilities of VisionAD make it particularly appealing for real-world applications where samples are scarce or expensive to obtain. Code is available at https://github.com/Qiqigeww/VisionAD.

Surface anomaly detection is a vital component in manufacturing inspection. Current discriminative methods follow a two-stage architecture composed of a reconstructive network followed by a discriminative network that relies on the reconstruction output. Currently used reconstructive networks often produce poor reconstructions that either still contain anomalies or lack details in anomaly-free regions. Discriminative methods are robust to some reconstructive network failures, suggesting that the discriminative network learns a strong normal appearance signal that the reconstructive networks miss. We reformulate the two-stage architecture into a single-stage iterative process that allows the exchange of information between the reconstruction and localization. We propose a novel transparency-based diffusion process where the transparency of anomalous regions is progressively increased, restoring their normal appearance accurately while maintaining the appearance of anomaly-free regions using localization cues of previous steps. We implement the proposed process as TRANSparency DifFUSION (TransFusion), a novel discriminative anomaly detection method that achieves state-of-the-art performance on both the VisA and the MVTec AD datasets, with an image-level AUROC of 98.5% and 99.2%, respectively. Code: https://github.com/MaticFuc/ECCV_TransFusion

We introduce a novel problem, i.e., the localization of an input image within a multi-modal reference map represented by a database of 3D scene graphs. These graphs comprise multiple modalities, including object-level point clouds, images, attributes, and relationships between objects, offering a lightweight and efficient alternative to conventional methods that rely on extensive image databases. Given the available modalities, the proposed method SceneGraphLoc learns a fixed-sized embedding for each node (i.e., representing an object instance) in the scene graph, enabling effective matching with the objects visible in the input query image. This strategy significantly outperforms other cross-modal methods, even without incorporating images into the map embeddings. When images are leveraged, SceneGraphLoc achieves performance close to that of state-of-the-art techniques depending on large image databases, while requiring three orders-of-magnitude less storage and operating orders-of-magnitude faster. The code will be made public.

While large multimodal models (LMMs) have achieved remarkable progress, generating pixel-level masks for image reasoning tasks involving multiple open-world targets remains a challenge. To bridge this gap, we introduce PixelLM, an effective and efficient LMM for pixel-level reasoning and understanding. Central to PixelLM is a novel, lightweight pixel decoder and a comprehensive segmentation codebook. The decoder efficiently produces masks from the hidden embeddings of the codebook tokens, which encode detailed target-relevant information. With this design, PixelLM harmonizes with the structure of popular LMMs and avoids the need for additional costly segmentation models. Furthermore, we propose a target refinement loss to enhance the model's ability to differentiate between multiple targets, leading to substantially improved mask quality. To advance research in this area, we construct MUSE, a high-quality multi-target reasoning segmentation benchmark. PixelLM excels across various pixel-level image reasoning and understanding tasks, outperforming well-established methods in multiple benchmarks, including MUSE, single- and multi-referring segmentation. Comprehensive ablations confirm the efficacy of each proposed component. All code, models, and datasets will be publicly available.

We present a transformer-based image anomaly detection and localization network. Our proposed model is a combination of a reconstruction-based approach and patch embedding. The use of transformer networks helps to preserve the spatial information of the embedded patches, which are later processed by a Gaussian mixture density network to localize the anomalous areas. In addition, we also publish BTAD, a real-world industrial anomaly dataset. Our results are compared with other state-of-the-art algorithms using publicly available datasets like MNIST and MVTec.

3D anomaly detection and localization is of great significance for industrial inspection. Prior 3D anomaly detection and localization methods focus on the setting that the testing data share the same category as the training data which is normal. However, in real-world applications, the normal training data for the target 3D objects can be unavailable due to issues like data privacy or export control regulation. To tackle these challenges, we identify a new task -- zero-shot 3D anomaly detection and localization, where the training and testing classes do not overlap. To this end, we design 3DzAL, a novel patch-level contrastive learning framework based on pseudo anomalies generated using the inductive bias from task-irrelevant 3D xyz data to learn more representative feature representations. Furthermore, we train a normalcy classifier network to classify the normal patches and pseudo anomalies and utilize the classification result jointly with feature distance to design anomaly scores. Instead of directly using the patch point clouds, we introduce adversarial perturbations to the input patch xyz data before feeding into the 3D normalcy classifier for the classification-based anomaly score. We show that 3DzAL outperforms the state-of-the-art anomaly detection and localization performance.

Existing deep learning based image inpainting methods use a standard convolutional network over the corrupted image, using convolutional filter responses conditioned on both valid pixels as well as the substitute values in the masked holes (typically the mean value). This often leads to artifacts such as color discrepancy and blurriness. Post-processing is usually used to reduce such artifacts, but are expensive and may fail. We propose the use of partial convolutions, where the convolution is masked and renormalized to be conditioned on only valid pixels. We further include a mechanism to automatically generate an updated mask for the next layer as part of the forward pass. Our model outperforms other methods for irregular masks. We show qualitative and quantitative comparisons with other methods to validate our approach.

Large Vision-Language Models (LVLMs) such as MiniGPT-4 and LLaVA have demonstrated the capability of understanding images and achieved remarkable performance in various visual tasks. Despite their strong abilities in recognizing common objects due to extensive training datasets, they lack specific domain knowledge and have a weaker understanding of localized details within objects, which hinders their effectiveness in the Industrial Anomaly Detection (IAD) task. On the other hand, most existing IAD methods only provide anomaly scores and necessitate the manual setting of thresholds to distinguish between normal and abnormal samples, which restricts their practical implementation. In this paper, we explore the utilization of LVLM to address the IAD problem and propose AnomalyGPT, a novel IAD approach based on LVLM. We generate training data by simulating anomalous images and producing corresponding textual descriptions for each image. We also employ an image decoder to provide fine-grained semantic and design a prompt learner to fine-tune the LVLM using prompt embeddings. Our AnomalyGPT eliminates the need for manual threshold adjustments, thus directly assesses the presence and locations of anomalies. Additionally, AnomalyGPT supports multi-turn dialogues and exhibits impressive few-shot in-context learning capabilities. With only one normal shot, AnomalyGPT achieves the state-of-the-art performance with an accuracy of 86.1%, an image-level AUC of 94.1%, and a pixel-level AUC of 95.3% on the MVTec-AD dataset. Code is available at https://github.com/CASIA-IVA-Lab/AnomalyGPT.

Existing image inpainting methods typically fill holes by borrowing information from surrounding pixels. They often produce unsatisfactory results when the holes overlap with or touch foreground objects due to lack of information about the actual extent of foreground and background regions within the holes. These scenarios, however, are very important in practice, especially for applications such as the removal of distracting objects. To address the problem, we propose a foreground-aware image inpainting system that explicitly disentangles structure inference and content completion. Specifically, our model learns to predict the foreground contour first, and then inpaints the missing region using the predicted contour as guidance. We show that by such disentanglement, the contour completion model predicts reasonable contours of objects, and further substantially improves the performance of image inpainting. Experiments show that our method significantly outperforms existing methods and achieves superior inpainting results on challenging cases with complex compositions.

Zero-shot anomaly classification (AC) and segmentation (AS) methods aim to identify and outline defects without using any labeled samples. In this paper, we reveal a key property that is overlooked by existing methods: normal image patches across industrial products typically find many other similar patches, not only in 2D appearance but also in 3D shapes, while anomalies remain diverse and isolated. To explicitly leverage this discriminative property, we propose a Mutual Scoring framework (MuSc-V2) for zero-shot AC/AS, which flexibly supports single 2D/3D or multimodality. Specifically, our method begins by improving 3D representation through Iterative Point Grouping (IPG), which reduces false positives from discontinuous surfaces. Then we use Similarity Neighborhood Aggregation with Multi-Degrees (SNAMD) to fuse 2D/3D neighborhood cues into more discriminative multi-scale patch features for mutual scoring. The core comprises a Mutual Scoring Mechanism (MSM) that lets samples within each modality to assign score to each other, and Cross-modal Anomaly Enhancement (CAE) that fuses 2D and 3D scores to recover modality-specific missing anomalies. Finally, Re-scoring with Constrained Neighborhood (RsCon) suppresses false classification based on similarity to more representative samples. Our framework flexibly works on both the full dataset and smaller subsets with consistently robust performance, ensuring seamless adaptability across diverse product lines. In aid of the novel framework, MuSc-V2 achieves significant performance improvements: a +23.7% AP gain on the MVTec 3D-AD dataset and a +19.3% boost on the Eyecandies dataset, surpassing previous zero-shot benchmarks and even outperforming most few-shot methods. The code will be available at The code will be available at https://github.com/HUST-SLOW/MuSc-V2{https://github.com/HUST-SLOW/MuSc-V2}.

Surface normal integration is a fundamental problem in computer vision, dealing with the objective of reconstructing a surface from its corresponding normal map. Existing approaches require an iterative global optimization to jointly estimate the depth of each pixel, which scales poorly to larger normal maps. In this paper, we address this problem by recasting normal integration as the estimation of relative scales of continuous components. By constraining pixels belonging to the same component to jointly vary their scale, we drastically reduce the number of optimization variables. Our framework includes a heuristic to accurately estimate continuous components from the start, a strategy to rebalance optimization terms, and a technique to iteratively merge components to further reduce the size of the problem. Our method achieves state-of-the-art results on the standard normal integration benchmark in as little as a few seconds and achieves one-order-of-magnitude speedup over pixel-level approaches on large-resolution normal maps.

Diffusion-based editing enables realistic modification of local image regions, making AI-generated content harder to detect. Existing AIGC detection benchmarks focus on classifying entire images, overlooking the localization of diffusion-based edits. We introduce DiffSeg30k, a publicly available dataset of 30k diffusion-edited images with pixel-level annotations, designed to support fine-grained detection. DiffSeg30k features: 1) In-the-wild images--we collect images or image prompts from COCO to reflect real-world content diversity; 2) Diverse diffusion models--local edits using eight SOTA diffusion models; 3) Multi-turn editing--each image undergoes up to three sequential edits to mimic real-world sequential editing; and 4) Realistic editing scenarios--a vision-language model (VLM)-based pipeline automatically identifies meaningful regions and generates context-aware prompts covering additions, removals, and attribute changes. DiffSeg30k shifts AIGC detection from binary classification to semantic segmentation, enabling simultaneous localization of edits and identification of the editing models. We benchmark three baseline segmentation approaches, revealing significant challenges in semantic segmentation tasks, particularly concerning robustness to image distortions. Experiments also reveal that segmentation models, despite being trained for pixel-level localization, emerge as highly reliable whole-image classifiers of diffusion edits, outperforming established forgery classifiers while showing great potential in cross-generator generalization. We believe DiffSeg30k will advance research in fine-grained localization of AI-generated content by demonstrating the promise and limitations of segmentation-based methods. DiffSeg30k is released at: https://huggingface.co/datasets/Chaos2629/Diffseg30k

Image and video inpainting is a classic problem in computer vision and computer graphics, aiming to fill in the plausible and realistic content in the missing areas of images and videos. With the advance of deep learning, this problem has achieved significant progress recently. The goal of this paper is to comprehensively review the deep learning-based methods for image and video inpainting. Specifically, we sort existing methods into different categories from the perspective of their high-level inpainting pipeline, present different deep learning architectures, including CNN, VAE, GAN, diffusion models, etc., and summarize techniques for module design. We review the training objectives and the common benchmark datasets. We present evaluation metrics for low-level pixel and high-level perceptional similarity, conduct a performance evaluation, and discuss the strengths and weaknesses of representative inpainting methods. We also discuss related real-world applications. Finally, we discuss open challenges and suggest potential future research directions.

Real-world images often suffer from spatially diverse degradations such as haze, rain, snow, and low-light, significantly impacting visual quality and downstream vision tasks. Existing all-in-one restoration (AIR) approaches either depend on external text prompts or embed hand-crafted architectural priors (e.g., frequency heuristics); both impose discrete, brittle assumptions that weaken generalization to unseen or mixed degradations. To address this limitation, we propose to reframe AIR as learned latent prior inference, where degradation-aware representations are automatically inferred from the input without explicit task cues. Based on latent priors, we formulate AIR as a structured reasoning paradigm: (1) which features to route (adaptive feature selection), (2) where to restore (spatial localization), and (3) what to restore (degradation semantics). We design a lightweight decoding module that efficiently leverages these latent encoded cues for spatially-adaptive restoration. Extensive experiments across six common degradation tasks, five compound settings, and previously unseen degradations demonstrate that our method outperforms state-of-the-art (SOTA) approaches, achieving an average PSNR improvement of 1.68 dB while being three times more efficient.

Reconstructing and rendering 3D objects from highly sparse views is of critical importance for promoting applications of 3D vision techniques and improving user experience. However, images from sparse views only contain very limited 3D information, leading to two significant challenges: 1) Difficulty in building multi-view consistency as images for matching are too few; 2) Partially omitted or highly compressed object information as view coverage is insufficient. To tackle these challenges, we propose GaussianObject, a framework to represent and render the 3D object with Gaussian splatting, that achieves high rendering quality with only 4 input images. We first introduce techniques of visual hull and floater elimination which explicitly inject structure priors into the initial optimization process for helping build multi-view consistency, yielding a coarse 3D Gaussian representation. Then we construct a Gaussian repair model based on diffusion models to supplement the omitted object information, where Gaussians are further refined. We design a self-generating strategy to obtain image pairs for training the repair model. Our GaussianObject is evaluated on several challenging datasets, including MipNeRF360, OmniObject3D, and OpenIllumination, achieving strong reconstruction results from only 4 views and significantly outperforming previous state-of-the-art methods.

Recent generative models show impressive performance in generating photographic images. Humans can hardly distinguish such incredibly realistic-looking AI-generated images from real ones. AI-generated images may lead to ubiquitous disinformation dissemination. Therefore, it is of utmost urgency to develop a detector to identify AI generated images. Most existing detectors suffer from sharp performance drops over unseen generative models. In this paper, we propose a novel AI-generated image detector capable of identifying fake images created by a wide range of generative models. We observe that the texture patches of images tend to reveal more traces left by generative models compared to the global semantic information of the images. A novel Smash&Reconstruction preprocessing is proposed to erase the global semantic information and enhance texture patches. Furthermore, pixels in rich texture regions exhibit more significant fluctuations than those in poor texture regions. Synthesizing realistic rich texture regions proves to be more challenging for existing generative models. Based on this principle, we leverage the inter-pixel correlation contrast between rich and poor texture regions within an image to further boost the detection performance. In addition, we build a comprehensive AI-generated image detection benchmark, which includes 17 kinds of prevalent generative models, to evaluate the effectiveness of existing baselines and our approach. Our benchmark provides a leaderboard for follow-up studies. Extensive experimental results show that our approach outperforms state-of-the-art baselines by a significant margin. Our project: https://fdmas.github.io/AIGCDetect

Implicit representation of an image can map arbitrary coordinates in the continuous domain to their corresponding color values, presenting a powerful capability for image reconstruction. Nevertheless, existing implicit representation approaches only focus on building continuous appearance mapping, ignoring the continuities of the semantic information across pixels. As a result, they can hardly achieve desired reconstruction results when the semantic information within input images is corrupted, for example, a large region misses. To address the issue, we propose to learn semantic-aware implicit representation (SAIR), that is, we make the implicit representation of each pixel rely on both its appearance and semantic information (\eg, which object does the pixel belong to). To this end, we propose a framework with two modules: (1) building a semantic implicit representation (SIR) for a corrupted image whose large regions miss. Given an arbitrary coordinate in the continuous domain, we can obtain its respective text-aligned embedding indicating the object the pixel belongs. (2) building an appearance implicit representation (AIR) based on the SIR. Given an arbitrary coordinate in the continuous domain, we can reconstruct its color whether or not the pixel is missed in the input. We validate the novel semantic-aware implicit representation method on the image inpainting task, and the extensive experiments demonstrate that our method surpasses state-of-the-art approaches by a significant margin.

Editing 4D scenes reconstructed from monocular videos based on text prompts is a valuable yet challenging task with broad applications in content creation and virtual environments. The key difficulty lies in achieving semantically precise edits in localized regions of complex, dynamic scenes, while preserving the integrity of unedited content. To address this, we introduce Mono4DEditor, a novel framework for flexible and accurate text-driven 4D scene editing. Our method augments 3D Gaussians with quantized CLIP features to form a language-embedded dynamic representation, enabling efficient semantic querying of arbitrary spatial regions. We further propose a two-stage point-level localization strategy that first selects candidate Gaussians via CLIP similarity and then refines their spatial extent to improve accuracy. Finally, targeted edits are performed on localized regions using a diffusion-based video editing model, with flow and scribble guidance ensuring spatial fidelity and temporal coherence. Extensive experiments demonstrate that Mono4DEditor enables high-quality, text-driven edits across diverse scenes and object types, while preserving the appearance and geometry of unedited areas and surpassing prior approaches in both flexibility and visual fidelity.

Vision Transformer models trained on large-scale datasets, although effective, often exhibit artifacts in the patch token they extract. While such defects can be alleviated by re-training the entire model with additional classification tokens, the underlying reasons for the presence of these tokens remain unclear. In this paper, we conduct a thorough investigation of this phenomenon, combining theoretical analysis with empirical observations. Our findings reveal that these artifacts originate from the pre-trained network itself, specifically stemming from the leading left singular vector of the network's weights. Furthermore, to mitigate these defects, we propose a novel fine-tuning smooth regularization that rectifies structural deficiencies using only a small dataset, thereby avoiding the need for complete re-training. We validate our method on various downstream tasks, including unsupervised segmentation, classification, supervised segmentation, and depth estimation, demonstrating its effectiveness in improving model performance. Codes and checkpoints are available at https://github.com/haoqiwang/sinder.

Unsupervised reconstruction networks using self-attention transformers have achieved state-of-the-art performance for multi-class (unified) anomaly detection with a single model. However, these self-attention reconstruction models primarily operate on target features, which may result in perfect reconstruction for both normal and anomaly features due to high consistency with context, leading to failure in detecting anomalies. Additionally, these models often produce inaccurate anomaly segmentation due to performing reconstruction in a low spatial resolution latent space. To enable reconstruction models enjoying high efficiency while enhancing their generalization for unified anomaly detection, we propose a simple yet effective method that reconstructs normal features and restores anomaly features with just One Normal Image Prompt (OneNIP). In contrast to previous work, OneNIP allows for the first time to reconstruct or restore anomalies with just one normal image prompt, effectively boosting unified anomaly detection performance. Furthermore, we propose a supervised refiner that regresses reconstruction errors by using both real normal and synthesized anomalous images, which significantly improves pixel-level anomaly segmentation. OneNIP outperforms previous methods on three industry anomaly detection benchmarks: MVTec, BTAD, and VisA. The code and pre-trained models are available at https://github.com/gaobb/OneNIP.

Anomaly Detection and Segmentation (AD&S) is crucial for industrial quality control. While existing methods excel in generating anomaly scores for each pixel, practical applications require producing a binary segmentation to identify anomalies. Due to the absence of labeled anomalies in many real scenarios, standard practices binarize these maps based on some statistics derived from a validation set containing only nominal samples, resulting in poor segmentation performance. This paper addresses this problem by proposing a test time training strategy to improve the segmentation performance. Indeed, at test time, we can extract rich features directly from anomalous samples to train a classifier that can discriminate defects effectively. Our general approach can work downstream to any AD&S method that provides an anomaly score map as output, even in multimodal settings. We demonstrate the effectiveness of our approach over baselines through extensive experimentation and evaluation on MVTec AD and MVTec 3D-AD.

This paper introduces the first two pixel retrieval benchmarks. Pixel retrieval is segmented instance retrieval. Like semantic segmentation extends classification to the pixel level, pixel retrieval is an extension of image retrieval and offers information about which pixels are related to the query object. In addition to retrieving images for the given query, it helps users quickly identify the query object in true positive images and exclude false positive images by denoting the correlated pixels. Our user study results show pixel-level annotation can significantly improve the user experience. Compared with semantic and instance segmentation, pixel retrieval requires a fine-grained recognition capability for variable-granularity targets. To this end, we propose pixel retrieval benchmarks named PROxford and PRParis, which are based on the widely used image retrieval datasets, ROxford and RParis. Three professional annotators label 5,942 images with two rounds of double-checking and refinement. Furthermore, we conduct extensive experiments and analysis on the SOTA methods in image search, image matching, detection, segmentation, and dense matching using our pixel retrieval benchmarks. Results show that the pixel retrieval task is challenging to these approaches and distinctive from existing problems, suggesting that further research can advance the content-based pixel-retrieval and thus user search experience. The datasets can be downloaded from https://github.com/anguoyuan/Pixel_retrieval-Segmented_instance_retrieval{this link}.

Ensuring reliable confidence scores from deep neural networks is of paramount significance in critical decision-making systems, particularly in real-world domains such as healthcare. Recent literature on calibrating deep segmentation networks has resulted in substantial progress. Nevertheless, these approaches are strongly inspired by the advancements in classification tasks, and thus their uncertainty is usually modeled by leveraging the information of individual pixels, disregarding the local structure of the object of interest. Indeed, only the recent Spatially Varying Label Smoothing (SVLS) approach considers pixel spatial relationships across classes, by softening the pixel label assignments with a discrete spatial Gaussian kernel. In this work, we first present a constrained optimization perspective of SVLS and demonstrate that it enforces an implicit constraint on soft class proportions of surrounding pixels. Furthermore, our analysis shows that SVLS lacks a mechanism to balance the contribution of the constraint with the primary objective, potentially hindering the optimization process. Based on these observations, we propose NACL (Neighbor Aware CaLibration), a principled and simple solution based on equality constraints on the logit values, which enables to control explicitly both the enforced constraint and the weight of the penalty, offering more flexibility. Comprehensive experiments on a wide variety of well-known segmentation benchmarks demonstrate the superior calibration performance of the proposed approach, without affecting its discriminative power. Furthermore, ablation studies empirically show the model agnostic nature of our approach, which can be used to train a wide span of deep segmentation networks.

Vision Transformers (ViTs) have emerged as the dominant architecture for visual processing tasks, demonstrating excellent scalability with increased training data and model size. However, recent work has identified the emergence of artifact tokens in ViTs that are incongruous with the local semantics. These anomalous tokens degrade ViT performance in tasks that require fine-grained localization or structural coherence. An effective mitigation of this issue is to the addition of register tokens to ViTs, which implicitly "absorb" the artifact term during training. Given the availability of various large-scale pre-trained ViTs, in this paper we aim at equipping them with such register tokens without the need of re-training them from scratch, which is infeasible considering their size. Specifically, we propose Post Hoc Registers (PH-Reg), an efficient self-distillation method that integrates registers into an existing ViT without requiring additional labeled data and full retraining. PH-Reg initializes both teacher and student networks from the same pre-trained ViT. The teacher remains frozen and unmodified, while the student is augmented with randomly initialized register tokens. By applying test-time augmentation to the teacher's inputs, we generate denoised dense embeddings free of artifacts, which are then used to optimize only a small subset of unlocked student weights. We show that our approach can effectively reduce the number of artifact tokens, improving the segmentation and depth prediction of the student ViT under zero-shot and linear probing.

Visual anomaly detection, an important problem in computer vision, is usually formulated as a one-class classification and segmentation task. The student-teacher (S-T) framework has proved to be effective in solving this challenge. However, previous works based on S-T only empirically applied constraints on normal data and fused multi-level information. In this study, we propose an improved model called DeSTSeg, which integrates a pre-trained teacher network, a denoising student encoder-decoder, and a segmentation network into one framework. First, to strengthen the constraints on anomalous data, we introduce a denoising procedure that allows the student network to learn more robust representations. From synthetically corrupted normal images, we train the student network to match the teacher network feature of the same images without corruption. Second, to fuse the multi-level S-T features adaptively, we train a segmentation network with rich supervision from synthetic anomaly masks, achieving a substantial performance improvement. Experiments on the industrial inspection benchmark dataset demonstrate that our method achieves state-of-the-art performance, 98.6% on image-level AUC, 75.8% on pixel-level average precision, and 76.4% on instance-level average precision.

This paper studies zero-shot anomaly classification (AC) and segmentation (AS) in industrial vision. We reveal that the abundant normal and abnormal cues implicit in unlabeled test images can be exploited for anomaly determination, which is ignored by prior methods. Our key observation is that for the industrial product images, the normal image patches could find a relatively large number of similar patches in other unlabeled images, while the abnormal ones only have a few similar patches. We leverage such a discriminative characteristic to design a novel zero-shot AC/AS method by Mutual Scoring (MuSc) of the unlabeled images, which does not need any training or prompts. Specifically, we perform Local Neighborhood Aggregation with Multiple Degrees (LNAMD) to obtain the patch features that are capable of representing anomalies in varying sizes. Then we propose the Mutual Scoring Mechanism (MSM) to leverage the unlabeled test images to assign the anomaly score to each other. Furthermore, we present an optimization approach named Re-scoring with Constrained Image-level Neighborhood (RsCIN) for image-level anomaly classification to suppress the false positives caused by noises in normal images. The superior performance on the challenging MVTec AD and VisA datasets demonstrates the effectiveness of our approach. Compared with the state-of-the-art zero-shot approaches, MuSc achieves a 21.1% PRO absolute gain (from 72.7% to 93.8%) on MVTec AD, a 19.4% pixel-AP gain and a 14.7% pixel-AUROC gain on VisA. In addition, our zero-shot approach outperforms most of the few-shot approaches and is comparable to some one-class methods. Code is available at https://github.com/xrli-U/MuSc.

We introduce LDL, a fast and robust algorithm that localizes a panorama to a 3D map using line segments. LDL focuses on the sparse structural information of lines in the scene, which is robust to illumination changes and can potentially enable efficient computation. While previous line-based localization approaches tend to sacrifice accuracy or computation time, our method effectively observes the holistic distribution of lines within panoramic images and 3D maps. Specifically, LDL matches the distribution of lines with 2D and 3D line distance functions, which are further decomposed along principal directions of lines to increase the expressiveness. The distance functions provide coarse pose estimates by comparing the distributional information, where the poses are further optimized using conventional local feature matching. As our pipeline solely leverages line geometry and local features, it does not require costly additional training of line-specific features or correspondence matching. Nevertheless, our method demonstrates robust performance on challenging scenarios including object layout changes, illumination shifts, and large-scale scenes, while exhibiting fast pose search terminating within a matter of milliseconds. We thus expect our method to serve as a practical solution for line-based localization, and complement the well-established point-based paradigm. The code for LDL is available through the following link: https://github.com/82magnolia/panoramic-localization.

In this work, we introduce Pixelsmith, a zero-shot text-to-image generative framework to sample images at higher resolutions with a single GPU. We are the first to show that it is possible to scale the output of a pre-trained diffusion model by a factor of 1000, opening the road for gigapixel image generation at no additional cost. Our cascading method uses the image generated at the lowest resolution as a baseline to sample at higher resolutions. For the guidance, we introduce the Slider, a tunable mechanism that fuses the overall structure contained in the first-generated image with enhanced fine details. At each inference step, we denoise patches rather than the entire latent space, minimizing memory demands such that a single GPU can handle the process, regardless of the image's resolution. Our experimental results show that Pixelsmith not only achieves higher quality and diversity compared to existing techniques, but also reduces sampling time and artifacts. The code for our work is available at https://github.com/Thanos-DB/Pixelsmith.

The increasing realism of synthetic images generated by advanced models such as VAEs, GANs, and LDMs poses significant challenges for synthetic image detection. To address this issue, we explore two artifact types introduced during the generation process: (1) latent distribution deviations and (2) decoding-induced smoothing effects, which manifest as inconsistencies in local textures, edges, and color transitions. Leveraging local pixel dependencies (LPD) properties rooted in Markov Random Fields, we reconstruct synthetic images using neighboring pixel information to expose disruptions in texture continuity and edge coherence. Building upon LPD, we propose FerretNet, a lightweight neural network with only 1.1M parameters that delivers efficient and robust synthetic image detection. Extensive experiments demonstrate that FerretNet, trained exclusively on the 4-class ProGAN dataset, achieves an average accuracy of 97.1% on an open-world benchmark comprising 22 generative models. Our code and datasets are publicly available at https://github.com/xigua7105/FerretNet.

Image inpainting has made significant advances in recent years. However, it is still challenging to recover corrupted images with both vivid textures and reasonable structures. Some specific methods only tackle regular textures while losing holistic structures due to the limited receptive fields of convolutional neural networks (CNNs). On the other hand, attention-based models can learn better long-range dependency for the structure recovery, but they are limited by the heavy computation for inference with large image sizes. To address these issues, we propose to leverage an additional structure restorer to facilitate the image inpainting incrementally. The proposed model restores holistic image structures with a powerful attention-based transformer model in a fixed low-resolution sketch space. Such a grayscale space is easy to be upsampled to larger scales to convey correct structural information. Our structure restorer can be integrated with other pretrained inpainting models efficiently with the zero-initialized residual addition. Furthermore, a masking positional encoding strategy is utilized to improve the performance with large irregular masks. Extensive experiments on various datasets validate the efficacy of our model compared with other competitors. Our codes are released in https://github.com/DQiaole/ZITS_inpainting.

Deep learning has improved vanishing point detection in images. Yet, deep networks require expensive annotated datasets trained on costly hardware and do not generalize to even slightly different domains, and minor problem variants. Here, we address these issues by injecting deep vanishing point detection networks with prior knowledge. This prior knowledge no longer needs to be learned from data, saving valuable annotation efforts and compute, unlocking realistic few-sample scenarios, and reducing the impact of domain changes. Moreover, the interpretability of the priors allows to adapt deep networks to minor problem variations such as switching between Manhattan and non-Manhattan worlds. We seamlessly incorporate two geometric priors: (i) Hough Transform -- mapping image pixels to straight lines, and (ii) Gaussian sphere -- mapping lines to great circles whose intersections denote vanishing points. Experimentally, we ablate our choices and show comparable accuracy to existing models in the large-data setting. We validate our model's improved data efficiency, robustness to domain changes, adaptability to non-Manhattan settings.

In this work, we aim to enhance model-based face reconstruction by avoiding fitting the model to outliers, i.e. regions that cannot be well-expressed by the model such as occluders or make-up. The core challenge for localizing outliers is that they are highly variable and difficult to annotate. To overcome this challenging problem, we introduce a joint Face-autoencoder and outlier segmentation approach (FOCUS).In particular, we exploit the fact that the outliers cannot be fitted well by the face model and hence can be localized well given a high-quality model fitting. The main challenge is that the model fitting and the outlier segmentation are mutually dependent on each other, and need to be inferred jointly. We resolve this chicken-and-egg problem with an EM-type training strategy, where a face autoencoder is trained jointly with an outlier segmentation network. This leads to a synergistic effect, in which the segmentation network prevents the face encoder from fitting to the outliers, enhancing the reconstruction quality. The improved 3D face reconstruction, in turn, enables the segmentation network to better predict the outliers. To resolve the ambiguity between outliers and regions that are difficult to fit, such as eyebrows, we build a statistical prior from synthetic data that measures the systematic bias in model fitting. Experiments on the NoW testset demonstrate that FOCUS achieves SOTA 3D face reconstruction performance among all baselines that are trained without 3D annotation. Moreover, our results on CelebA-HQ and the AR database show that the segmentation network can localize occluders accurately despite being trained without any segmentation annotation.

Most convolutional network (CNN)-based inpainting methods adopt standard convolution to indistinguishably treat valid pixels and holes, making them limited in handling irregular holes and more likely to generate inpainting results with color discrepancy and blurriness. Partial convolution has been suggested to address this issue, but it adopts handcrafted feature re-normalization, and only considers forward mask-updating. In this paper, we present a learnable attention map module for learning feature renormalization and mask-updating in an end-to-end manner, which is effective in adapting to irregular holes and propagation of convolution layers. Furthermore, learnable reverse attention maps are introduced to allow the decoder of U-Net to concentrate on filling in irregular holes instead of reconstructing both holes and known regions, resulting in our learnable bidirectional attention maps. Qualitative and quantitative experiments show that our method performs favorably against state-of-the-arts in generating sharper, more coherent and visually plausible inpainting results. The source code and pre-trained models will be available.

Reading measurement instruments is effortless for humans and requires relatively little domain expertise, yet it remains surprisingly challenging for current vision-language models (VLMs) as we find in preliminary evaluation. In this work, we introduce MeasureBench, a benchmark on visual measurement reading covering both real-world and synthesized images of various types of measurements, along with an extensible pipeline for data synthesis. Our pipeline procedurally generates a specified type of gauge with controllable visual appearance, enabling scalable variation in key details such as pointers, scales, fonts, lighting, and clutter. Evaluation on popular proprietary and open-weight VLMs shows that even the strongest frontier VLMs struggle measurement reading in general. A consistent failure mode is indicator localization: models can read digits or labels but misidentify the key positions of pointers or alignments, leading to big numeric errors despite plausible textual reasoning. We have also conducted preliminary experiments with reinforcement learning over synthetic data, and find encouraging results on in-domain synthetic subset but less promising for real-world images. Our analysis highlights a fundamental limitation of current VLMs in fine-grained spatial grounding. We hope this resource can help future advances on visually grounded numeracy and precise spatial perception of VLMs, bridging the gap between recognizing numbers and measuring the world.

Recent research has highlighted improvements in high-quality imaging guided by event cameras, with most of these efforts concentrating on the RGB domain. However, these advancements frequently neglect the unique challenges introduced by the inherent flaws in the sensor design of event cameras in the RAW domain. Specifically, this sensor design results in the partial loss of pixel values, posing new challenges for RAW domain processes like demosaicing. The challenge intensifies as most research in the RAW domain is based on the premise that each pixel contains a value, making the straightforward adaptation of these methods to event camera demosaicing problematic. To end this, we present a Swin-Transformer-based backbone and a pixel-focus loss function for demosaicing with missing pixel values in RAW domain processing. Our core motivation is to refine a general and widely applicable foundational model from the RGB domain for RAW domain processing, thereby broadening the model's applicability within the entire imaging process. Our method harnesses multi-scale processing and space-to-depth techniques to ensure efficiency and reduce computing complexity. We also proposed the Pixel-focus Loss function for network fine-tuning to improve network convergence based on our discovery of a long-tailed distribution in training loss. Our method has undergone validation on the MIPI Demosaic Challenge dataset, with subsequent analytical experimentation confirming its efficacy. All code and trained models are released here: https://github.com/yunfanLu/ev-demosaic

Surface defect detection is a critical task across numerous industries, aimed at efficiently identifying and localising imperfections or irregularities on manufactured components. While numerous methods have been proposed, many fail to meet industrial demands for high performance, efficiency, and adaptability. Existing approaches are often constrained to specific supervision scenarios and struggle to adapt to the diverse data annotations encountered in real-world manufacturing processes, such as unsupervised, weakly supervised, mixed supervision, and fully supervised settings. To address these challenges, we propose SuperSimpleNet, a highly efficient and adaptable discriminative model built on the foundation of SimpleNet. SuperSimpleNet incorporates a novel synthetic anomaly generation process, an enhanced classification head, and an improved learning procedure, enabling efficient training in all four supervision scenarios, making it the first model capable of fully leveraging all available data annotations. SuperSimpleNet sets a new standard for performance across all scenarios, as demonstrated by its results on four challenging benchmark datasets. Beyond accuracy, it is very fast, achieving an inference time below 10 ms. With its ability to unify diverse supervision paradigms while maintaining outstanding speed and reliability, SuperSimpleNet represents a promising step forward in addressing real-world manufacturing challenges and bridging the gap between academic research and industrial applications. Code: https://github.com/blaz-r/SuperSimpleNet